Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Han Kwang Nienhuys"'
Autor:
Christina L. Porter, Teis Coenen, Niels Geypen, Sandy Scholz, Loes van Rijswijk, Han-Kwang Nienhuys, Jeroen Ploegmakers, Johan Reinink, Hugo Cramer, Rik van Laarhoven, David O'Dwyer, Peter Smorenburg, Andrea Invernizzi, Ricarda Wohrwag, Hugo Jonquiere, Juliane Reinhardt, Omar El Gawhary, Simon G. J. Mathijssen, Peter D. Engblom, Heidi Chin, William T. Blanton, Sury Ganesan, Brian J. Krist, Florian Gstrein, Mark Phillips
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Autor:
Igor Alexandrovich Makhotkin, Jaromír Chalupský, Dorota Klinger, Ryszard Sobierajski, Libor Juha, Marek Jurek, Elke Plönjes, Iwanna Jacyna, Karel Saksl, Sebastian Strobel, Michael Störmer, Frank Siewert, Kai Tiedtke, Eric Louis, Barbara Keitel, Igor Milov, Věra Hájková, Tobias Mey, Laurent Nittler, R.A. Loch, Gosse de Vries, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Y. Syryanyy, Tomáš Burian, Han Kwang Nienhuys, Hartmut Enkisch, Grzegorz Gwalt, Bart Faatz, V. Vozda, Robbert Wilhelmus Elisabeth van de Kruijs, Frank Scholze
Publikováno v:
Journal of synchrotron radiation 25(1), 77-84 (2018). doi:10.1107/S1600577517017362
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of synchrotron radiation 25(1), 77 - 84 (2018). doi:10.1107/S1600577517017362
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
Autor:
Frank Siewert, Iwanna Jacyna, Jaromír Chalupský, Robbert Wilhelmus Elisabeth van de Kruijs, Nikita Medvedev, Ryszard Sobierajski, Elke Plönjes, Igor Alexandrovich Makhotkin, Fred Bijkerk, Barbara Keitel, R.A. Loch, Gosse de Vries, V. Vozda, Bart Faatz, Han-Kwang Nienhuys, Tomáš Burian, Grzegorz Gwalt, Igor Milov, Tobias Mey, Eric Louis, Siegfried Schreiber, Sebastian Strobel, Martin Hermann, Michael Störmer, Jacobus Marinus Sturm, Věra Hájková, Kai Tiedtke, Hartmut Enkisch, Karel Saksl, Sven Toleikis, Vladimir Lipp, Marek Jurek, Libor Juha
Publikováno v:
Optics express 26(15), 19665-19685 (2018). doi:10.1364/OE.26.019665
Optics express, 26(15), 19665-19685. The Optical Society
Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665)
Optics express, 26(15), 19665-19685. The Optical Society
Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665)
Optics express 26(15), 19665 - 19685 (2018). doi:10.1364/OE.26.019665
Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter inte
Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44c9434c6e13568444356468d4132f4e
Publikováno v:
Accounts of Chemical Research. 42:1332-1342
Surfaces and interfaces are omnipresent in nature. They are not just the place where two bulk media meet. Surfaces and interfaces play key roles in a diversity of fields ranging from heterogeneous catalysis and membrane biology to nanotechnology. The
Autor:
Arkady Yartsev, Olle Inganäs, Han-Kwang Nienhuys, Fengling Zhang, Villy Sundström, Hynek Nemec
Publikováno v:
The Journal of Physical Chemistry C. 112:6558-6563
Time-resolved terahertz spectroscopy is used for investigation of photoinduced charge carrier dynamics in blends of a polyfluorene copolymer (poly [2,7-(9,9-dioctyl-fluorene)-alt-5,5-(4',7'-di-2-thienyl-2',1',3-benzothi adiazole)]) and an electron ac
Autor:
Han-Kwang Nienhuys, Woutersen, Sander
Publikováno v:
Journal of Chemical Physics; 7/22/1999, Vol. 111 Issue 4, p1494, 7p, 4 Diagrams, 7 Graphs
Publikováno v:
Journal of Chemical Physics, 117(17), 8021-8029. American Chemical Society
We report on a two-color mid-infrared pump-probe spectroscopic study of the dynamics of the OH stretch vibrations of HDO molecules dissolved in a concentrated (10 M) solution of NaOD in D2O. We observe that spectral holes can be created in the broad
Publikováno v:
The Journal of Physical Chemistry A. 105:4622-4626
Femtosecond two-color mid-infrared pump−probe spectroscopy is used to study the vibrational relaxation and the hydrogen-bond dynamics of HDO dissolved in liquid H2O. By looking at the spectral dyna...
Publikováno v:
Chemical Physics. 258:233-245
The reorientational motion of the molecules in liquid water is investigated by measuring the anisotropy decay of the O–H stretching mode of HDO dissolved in D 2 O using femtosecond mid-infrared pump–probe spectroscopy. We observe that the anisotr
Publikováno v:
Journal of Chemical Physics, 112(9), 8487-8494. American Chemical Society
Femtosecond mid-infrared pump-probe spectroscopy is used to study the orientational relaxation of HDO molecules dissolved in liquid D2O. In this technique, the excitation of the O-H stretch vibration is used as a label in order to follow the orientat