Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Han Feng Chang"'
Publikováno v:
IEEE Transactions on Magnetics. 50:1-4
The In 10 Ge x Sb 52-x Sn 23 Te 15 films (x = 2, 5, 7, and 9) were grown on silicon wafers, glass, and polycarbonate substrates at room temperature by dc magnetron sputtering. The thickness of In 10 Ge x Sb 52-x Sn 23 Te 15 films is fixed at 20 nm. T
Publikováno v:
Journal of Nanomaterials, Vol 2014 (2014)
Mo/Si bilayer thin films were grown by magnetron sputtering and applied to write-once blu-ray disc (BD-R). The microstructures and optical storage properties of Mo/Si bilayer were investigated. From the temperature dependence of reflectivity measurem
Publikováno v:
Nonlinear Optics.
The crystallization temperature of the In10GexSb52-xSn23Te15 films (x = 2, 5, and 9) film is increased with increasing Ge content. The optimum jitter value of the film with 4X recording speed is 6.6%.
Publikováno v:
Nonlinear Optics.
The thermal property, optical property and recording characteristics of the CuSi (16 nm) film were investigated. The optimum jitter value of the film with 1X recording speed is 7.5% at 6 mW.
Autor:
Han-Feng Chang, 張翰峰
94
In this thesis, we characterize the performance of single-threaded and multi-threaded Java applications both on different hardware platforms and different software platforms. For this purpose, we adopt two benchmarks : SPECjvm98 Benchmark, an
In this thesis, we characterize the performance of single-threaded and multi-threaded Java applications both on different hardware platforms and different software platforms. For this purpose, we adopt two benchmarks : SPECjvm98 Benchmark, an
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/13103937415273723737
Publikováno v:
IEEE Transactions on Magnetics. 43:859-860
The authors succeeded in developing an innovative high-speed phase change material applied for DVD+RW dual layer recording media. The high transmittance of the front-side recording layer combining the stacking material and thin film structure was fou
Autor:
Chao-Te Lee, Tsung-Lin Tsai, S.C. Chen, Han-Feng Chang, Sin-Liang Ou, Chin-Yen Yeh, Don-Yau Chiang, Po-Cheng Kuo
Publikováno v:
Applied Physics Letters. 99:121908
The crystallization mechanisms of Si/CuSi bilayer and its recording characteristics for write-once blu-ray disc (BD-R) were investigated. It was found that Cu3Si phase appeared during the room temperature sputtered deposition. Then, the Si atoms in C
Publikováno v:
IEEE Transactions on Magnetics; Feb2007 Part 2 of 2, Vol. 43 Issue 2, p859-860, 3p, 5 Graphs