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A rigorous analysis of Electrostatic Discharge susceptibility of Multi Layer Ceramic (MLC) capacitors is carried out. The impact of ESD stress applied at the connector pins of an electronic control module, protected by utilizing 0603 package MLC capa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cbf5adcb1453a6cf46a1963a12032ad
http://hdl.handle.net/11583/2279572
http://hdl.handle.net/11583/2279572
Autor:
Sunil Ananthaneni, Steffen Raabe, Adrian P. Mancuso, Hamidreza Dadgostar, Mengning Liang, Heinz Graafsma, Patrik Vagovic, Marc Messerschmidt, Henry N. Chapman, Leonard M. G. Chavas, Stephan Stern
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 70:C1748-C1748
The Serial Femtosecond Crystallography (SFX) user's consortium apparatus is to be installed within the Single Particles, Clusters and Biomolecules (SPB) instrument of the European X-ray Free-Electron Laser facility (XFEL.EU) [1, 2]. The XFEL.EU will