Zobrazeno 1 - 1
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pro vyhledávání: '"Hami El Abdelkhalak"'
Publikováno v:
Applied Sciences, Vol 11, Iss 22, p 10720 (2021)
The main objective of our paper is to propose an approach to studying the mechatronic system’s reliability through the reliability of their high electron mobility transistors (HEMT). The operating temperature is one of the parameters that influence
Externí odkaz:
https://doaj.org/article/d08bccc224a84e4bb864331bb0c9b92c