Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Hamed Lakrout"'
Publikováno v:
Journal of Applied Polymer Science. 125:584-594
Cast polyurethane (PU) elastomers have been widely used in dynamic applications, such as rollers and wheels, where a low heat buildup, high-loading resistance, and good cut-growth resistance are desired. Because of their different molecular structure
Autor:
Robert K. Mcintyre, Lin Huang, Sergei Magonov, Charles R. Meyer, Valeriy V. Ginzburg, Chanmin Su, Natalia Erina, Hamed Lakrout, Alan F. Rice, Craig Prater, Sergey Belikov, Gregory F. Meyers
Publikováno v:
Journal of Physics: Conference Series. 61:1303-1307
Quantitative studies of mechanical behaviour and primarily elastic modulus are essential for material science at the nanometer scale. AFM nanoindentation is the most promising approach to address the problem. In our study we perform AFM-based nanoind
Publikováno v:
Macromolecules. 34:7448-7458
The effects of molecular weight and acrylic acid content on the adhesive properties of a series of monodisperse poly(n-butyl acrylate) materials have been investigated. The short-time adhesion, or ...
Publikováno v:
Journal of Applied Physics. 88:2956-2966
Adhesively bonded elastic layers with thicknesses that are small relative to their lateral dimensions are used in a wide variety of applications. The mechanical response of the compliant layer when a normal stress is imposed across its thickness is d
Publikováno v:
The Journal of Adhesion. 69:307-359
The adhesion mechanisms of two acrylic Pressure-Sensitive-Adhesives on a stainless steel probe are investigated with a custom-designed probe tack apparatus. Our setup allows the simultaneous acquisition of a nominal stress and strain curve, and the o
Publikováno v:
MRS Proceedings. 1269
Surface scratches in a series of controlled epoxy networks (CEN) were measured using a combination of instrumented indentation protocols and laser scanning confocal microscopy. Identical epoxy chemistry with increasing molecular weight between crossl
Autor:
Craig Prater, Bob McIntyre, Sergey Belikov, Valeriy V. Ginzburg, Gregory F. Meyers, Chanmin Su, Hamed Lakrout, Natalia Erina, Lin Huang, Sergei Magonov
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 27:984
The uncertainty of the shape of the tip is a significant source of error in atomic force microscopy (AFM) based quantitative nanomechanical measurements. Using transmission electron microscopy, scanning electron microscopy, or tip reconstruction imag