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Akademický článek
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Autor:
Hallman KA, Rodríguez-Suné L, Trull J, Cojocaru C, Vincenti MA, Akozbek N, Vilaseca R, Scalora M
Publikováno v:
Optics express [Opt Express] 2023 Jan 16; Vol. 31 (2), pp. 792-801.
Autor:
Vidas L, Günther CM, Miller TA, Pfau B, Perez-Salinas D, Martínez E, Schneider M, Gührs E, Gargiani P, Valvidares M, Marvel RE, Hallman KA, Haglund RF Jr, Eisebitt S, Wall S
Publikováno v:
Nano letters [Nano Lett] 2021 Sep 08; Vol. 21 (17), pp. 7426. Date of Electronic Publication: 2021 Aug 19.
Autor:
Johnson AS; ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Barcelona, Spain. allan.johnson@icfo.eu simon.wall@phys.au.dk., Conesa JV; ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Barcelona, Spain., Vidas L; ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Barcelona, Spain., Perez-Salinas D; ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Barcelona, Spain., Günther CM; Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany., Pfau B; Max-Born-Institut, 12489 Berlin, Germany., Hallman KA; Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235-1807, USA., Haglund RF Jr; Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235-1807, USA., Eisebitt S; Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany.; Max-Born-Institut, 12489 Berlin, Germany., Wall S; ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Barcelona, Spain. allan.johnson@icfo.eu simon.wall@phys.au.dk.; Department of Physics and Astronomy, Aarhus University, Ny Munkegade 120, 8000 Aarhus C, Denmark.
Publikováno v:
Science advances [Sci Adv] 2021 Aug 11; Vol. 7 (33). Date of Electronic Publication: 2021 Aug 11 (Print Publication: 2021).
Autor:
Vidas L; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , Castelldefels , 08860 Barcelona , Spain., Günther CM; Institut für Optik und Atomare Physik , Technische Universität Berlin , 10623 Berlin , Germany., Miller TA; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , Castelldefels , 08860 Barcelona , Spain., Pfau B; Max-Born-Institut , 12489 Berlin , Germany., Perez-Salinas D; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , Castelldefels , 08860 Barcelona , Spain., Martínez E; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , Castelldefels , 08860 Barcelona , Spain., Schneider M; Max-Born-Institut , 12489 Berlin , Germany., Gührs E; Institut für Optik und Atomare Physik , Technische Universität Berlin , 10623 Berlin , Germany., Gargiani P; ALBA Synchrotron Light Source , Cerdanyola del Vallès , E-08290 Barcelona , Spain., Valvidares M; ALBA Synchrotron Light Source , Cerdanyola del Vallès , E-08290 Barcelona , Spain., Marvel RE; Department of Physics and Astronomy , Vanderbilt University , Nashville , Tennessee 37235-1807 , United States., Hallman KA; Department of Physics and Astronomy , Vanderbilt University , Nashville , Tennessee 37235-1807 , United States., Haglund RF Jr; Department of Physics and Astronomy , Vanderbilt University , Nashville , Tennessee 37235-1807 , United States., Eisebitt S; Institut für Optik und Atomare Physik , Technische Universität Berlin , 10623 Berlin , Germany.; Max-Born-Institut , 12489 Berlin , Germany., Wall S; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , Castelldefels , 08860 Barcelona , Spain.
Publikováno v:
Nano letters [Nano Lett] 2018 Jun 13; Vol. 18 (6), pp. 3449-3453. Date of Electronic Publication: 2018 May 18.
Publikováno v:
Optics express [Opt Express] 2017 Oct 30; Vol. 25 (22), pp. 26527-26536.
Autor:
Ryckman JD; Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235, USA. j.ryckman@vanderbilt.edu, Hallman KA, Marvel RE, Haglund RF, Weiss SM
Publikováno v:
Optics express [Opt Express] 2013 May 06; Vol. 21 (9), pp. 10753-63.