Výsledky vyhledávání - "Halbach, Ralph"

Akademický článek

Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology

Autor: Alvarez, David, Chatty, Kiran, Russ, Christian, Abou-Khalil, Michel J., Li, Junjun, Gauthier, Robert, Esmark, Kai, Halbach, Ralph, Seguin, Christopher

Publikováno v: In Microelectronics Reliability 2009 49(12):1417-1423

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Conference

Identification and verification of BEOL metal fails due to ESD stress using current density analysis tool.

Autor: Mitra, Souvick, Palmer, Nicholas, Muhammad, Mujahid, Gauthier, Robert, Halbach, Ralph, Seguin, Chris

Publikováno v: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium; 2013, p1-6, 6p

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Conference

Maximizing ESD robustness of current-mode-logic (CML) driver with internal gate bias network.

Autor: Li, You, Di Sarro, James, Chang, Shunhua, Li, Junjun, Gauthier, Robert, Halbach, Ralph

Publikováno v: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium; 2013, p1-8, 8p

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Conference

Design and characterization of a multi-RC-triggered MOSFET-based power clamp for on-chip ESD protection.

Autor: Li, Junjun, Gauthier, Robert, Mitra, Souvick, Putnam, Christopher, Chatty, Kiran, Halbach, Ralph, Seguin, Christopher

Publikováno v: 2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p179-185, 7p

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