Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Hala M. Sobhi"'
Publikováno v:
Al-Kitab Journal for Pure Sciences, Vol 8, Iss 01 (2024)
The structural properties of thin films prepared with different thicknesses before and after the annealing process and at different temperatures were studied. X-ray diffraction (XRD), atomic force microscopy (AFM), and emission scanning electron micr
Externí odkaz:
https://doaj.org/article/fe7fb09a99a64d9ca1352c4b58cbddf9
