Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Haksong Kim"'
Autor:
Yunchol Pak, Xuejun Yang, Yongdok Kim, Chanhong Jong, Haksong Kim, Namhyok Lee, Songgun Kim, Yongchol Kim
Publikováno v:
Chinese Neurosurgical Journal, Vol 4, Iss 1, Pp 1-6 (2018)
Abstract Background A pituitary tumor is a tumor with a high incidence among brain tumors. Microscopic traditional STT approach with aid of endoscope has a high therapeutic effect and few complications. Methods The authors reviewed 146 patients who u
Externí odkaz:
https://doaj.org/article/7ebe70983baa427d9e73da993e238922
Autor:
Yongdok Kim, Yongchol Kim, Yunchol Pak, Haksong Kim, Songgun Kim, Namhyok Lee, Chanhong Jong, Xuejun Yang
Publikováno v:
Chinese Neurosurgical Journal, Vol 4, Iss 1, Pp 1-6 (2018)
Chinese Neurosurgical Journal
Chinese Neurosurgical Journal
Background A pituitary tumor is a tumor with a high incidence among brain tumors. Microscopic traditional STT approach with aid of endoscope has a high therapeutic effect and few complications. Methods The authors reviewed 146 patients who underwent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa627101d32bcf77aaa2dda9e476b4e1
http://link.springer.com/article/10.1186/s41016-018-0130-y
http://link.springer.com/article/10.1186/s41016-018-0130-y
Autor:
Geunho Choi, Hongjung Kim, Dong Uk Lee, Jong-sam Kim, Jun-Yong Song, Jonghoon Oh, Im Da-In, Jang Sungchun, Jaein Lee, Jonghyuck Choi, Yongsung Lee, Haksong Kim, Chang-Hyun Lee, Jae-il Kim, Kyung-Whan Kim, Jinil Chung, Sunmyung Choi, Seo Young-Suk, Dae-Suk Kim, Chang-Hyun Kim, Sanghui Kim, Sanghyun Ku, Joo-Hwan Cho, Min-Sik Han, Seong-Hwi Song, Kihun Kwon, Hankyu Chi, Junhyun Chun, Yeon-Uk Kim, Seungwook Oh, Yongmi Kim, Byeongchan Choi, Dongkyun Kim, Park Min-Su, Kibong Koo
Publikováno v:
ISSCC
Required system performance for the computing and server, cost and power forces DRAM to improve its bandwidth, capacity and power. DDR5 SDRAM has been proposed as the next memory solution, with various new functions and circuit techniques to overcome
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8936055dd78872fd46b279b4cb482399
https://doi.org/10.1109/isscc.2019.8662320
https://doi.org/10.1109/isscc.2019.8662320
Publikováno v:
IEEE Transactions on Reliability. 64:486-496
Wafer testing (wafer sort) is used in the semiconductor industry to reduce test costs. High parallelism is important to reduce test application time. However, increasing parallelism is becoming more difficult because the elements that drive test cost
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::875492c9c73ee1188085c22e82a839e1
https://doi.org/10.1109/tr.2014.2336395
https://doi.org/10.1109/tr.2014.2336395