Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Hakiem Hsu"'
Publikováno v:
Sensors, Vol 22, Iss 23, p 9327 (2022)
Over recent years, with the advances in image recognition technology for deep learning, researchers have devoted continued efforts toward importing anomaly detection technology into the production line of automatic optical detection. Although unsuper
Externí odkaz:
https://doaj.org/article/cde0c1f4eaa74bc08e498d26f1291253
Publikováno v:
Sensors, Vol 20, Iss 12, p 3336 (2020)
Recently, researchers have been studying methods to introduce deep learning into automated optical inspection (AOI) systems to reduce labor costs. However, the integration of deep learning in the industry may encounter major challenges such as sample
Externí odkaz:
https://doaj.org/article/a84c09b009d843d8bbbe21e7287d86bb
Publikováno v:
IET Image Processing. 17:1752-1761
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbb5c8b3c08204e0f017f78ed8760e8a
https://doi.org/10.1049/ipr2.12752
https://doi.org/10.1049/ipr2.12752
Publikováno v:
2021 IEEE 4th International Conference on Nanoscience and Technology (ICNST).
The traditional method of appearance defect detection is to rely on the examiner's personnel senses identification, but people's vision is lack of standard, and it is easy to cause false detection or missed detection due to fatigue or inattention. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00b0fe234577dfe26f2d7aacc27a7a11
https://doi.org/10.1109/icnst52433.2021.9509320
https://doi.org/10.1109/icnst52433.2021.9509320
Publikováno v:
Sensors, Vol 20, Iss 3336, p 3336 (2020)
Sensors
Volume 20
Issue 12
Sensors (Basel, Switzerland)
Sensors
Volume 20
Issue 12
Sensors (Basel, Switzerland)
Recently, researchers have been studying methods to introduce deep learning into automated optical inspection (AOI) systems to reduce labor costs. However, the integration of deep learning in the industry may encounter major challenges such as sample
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1696cdb146b44432e4d557037ebfaf23
https://www.mdpi.com/1424-8220/20/12/3336
https://www.mdpi.com/1424-8220/20/12/3336
Publikováno v:
SPIE Proceedings.
The performance of a typical machine vision system depends on the quality of the images that is directly affected by the illumination. In order to obtain high contrast images, the target must be illuminated in such a way that distinctions between tar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9254ebd32635e7001e3775f385eeb7d
https://doi.org/10.1117/12.716305
https://doi.org/10.1117/12.716305