Psychosocial and behavioral characteristics of still smokers at 6 months after acute cerebro or cardiovascular events: Findings from INEV@L, a prospective pilot study

Autor: Maurice Giroud, Edith Salès-Wuillemin, C. Truchot, Frédéric Chagué, Haithem Ayari, S. Guinchard, Marianne Zeller, Maud Maza, Yannick Béjot, Corine Aboa-Eboulé, Yves Cottin, Julien Chappé, L. Lorgis

Publikováno v: Archives of Cardiovascular Diseases Supplements
Archives of Cardiovascular Diseases Supplements, Elsevier/French Society of Cardiology, 2020, 12 (1), pp.156. ⟨10.1016/j.acvdsp.2019.09.323⟩

(IF: 0,12, SRJ H2; Q4); International audience; Considering the benefits of smoking cessation, and evolving new tobacco-product consumption, such as e-cigarettes (e-cig), contemporary behavioral and psychosocial factors (PSF) associated with smoking

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2f9524c657578e3f947b4be3937f22e8
https://hal-univ-bourgogne.archives-ouvertes.fr/hal-03115376

Multilevel Operation in Oxide Based Resistive RAM with SET voltage modulation

Autor: Mathieu Moreau, Santhosh Onkaraiah, J-M. Portal, Marc Bocquet, H. Aziza, Haithem Ayari

Publikováno v: 2016 11TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA (DTIS)
2016 11TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA (DTIS), Apr 2016, Istanbul, Turkey. pp.1-5, ⟨10.1109/DTIS.2016.7483892⟩
DTIS

International audience; In this paper multilevel storage characteristic in Oxide-based Resistive RAM (OxRRAM) is demonstrated by modulating the amplitude of the cell programming voltages. Four resistance levels are clearly obtained. Impact of variabi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54981641179e7a26327e0c81f9ab76d4
https://hal.archives-ouvertes.fr/hal-01434981

Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability

Autor: Mathieu Moreau, Hassen Aziza, J-M. Portal, Marc Bocquet, Santhosh Onkaraiah, Haithem Ayari

Publikováno v: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2014, Amsterdam, Netherlands. ⟨10.1109/DFT.2014.6962107⟩
DFT

International audience; A deeper understanding of the impact of variability on Oxide-based Resistive Random Access Memory (so-called OxRRAM) is needed to propose variability tolerant designs to ensure the robustness of the technology. Although resear

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a4e9ec3485a163239b397fd78b1385f
https://hal.science/hal-01745718

Implementing model redundancy in predictive alternate test to improve test confidence

Autor: Haithem Ayari, Florence Azais, Serge Bernard, Mariane Comte, Vincent Kcrzerho, Olivier Potin, Michel Renovell

Publikováno v: ETS: European Test Symposium
ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
ETS

International audience; This work investigates new implementations of the predictive alternate test strategy that exploit model redundancy in order to improve test confidence. The key idea is to build during the training phase, not only one regressio

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a8489eaac6f44fc8b080e09efdf344b
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820077

On the Use of Redundancy to Reduce Prediction Error in Alternate Analog/RF Test

Autor: Haithem Ayari, Florence Azaïs, Mariane Comte, Olivier Potin, Serge Bernard, Vincent Kerzérho, Michel Renovell

Publikováno v: 18th Annual IEEE International Mixed-Signals, Sensors, and Systems Test Workshop
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩

International audience; Specification testing, which involves the direct measurement of the circuit performance parameters is the conventional practice for testing analog/RF devices. While this approach is highly accurate, it often incurs extremely h

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23295f2b8c7fcce530c09c9a911ad9df
https://doi.org/10.1109/ims3tw.2012.17