Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Hainline AE"'
Autor:
Nath V; Computer Science, Vanderbilt University, Nashville, Tennessee, USA., Schilling KG; Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Huo Y; Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, Tennessee, USA., Barakovic M; Signal Processing Lab (LTS5), EPFL, Switzerland., Romascano D; Signal Processing Lab (LTS5), EPFL, Switzerland., Rafael-Patino J; Signal Processing Lab (LTS5), EPFL, Switzerland., Frigo M; Signal Processing Lab (LTS5), EPFL, Switzerland., Girard G; Signal Processing Lab (LTS5), EPFL, Switzerland., Thiran JP; Signal Processing Lab (LTS5), EPFL, Switzerland., Daducci A; Computer Science Department, University of Verona, Italy., Rowe M; Mint Labs Inc., Boston, Massachusetts, USA., Rodrigues P; Mint Labs Inc., Boston, Massachusetts, USA., Prčkovska V; Mint Labs Inc., Boston, Massachusetts, USA., Aydogan DB; Keck School of Medicine, University of Southern California (NICR), Los Angeles, California, USA., Sun W; Keck School of Medicine, University of Southern California (NICR), Los Angeles, California, USA., Shi Y; Keck School of Medicine, University of Southern California (NICR), Los Angeles, California, USA., Parker WA; Center for Biomedical Image Computing and Analytics, Dept. of Radiology, Perelman School of Medicine, University of Pennsylvania (UPENN), Philadelphia, Pennsylvania, USA., Ould Ismail AA; Center for Biomedical Image Computing and Analytics, Dept. of Radiology, Perelman School of Medicine, University of Pennsylvania (UPENN), Philadelphia, Pennsylvania, USA., Verma R; Center for Biomedical Image Computing and Analytics, Dept. of Radiology, Perelman School of Medicine, University of Pennsylvania (UPENN), Philadelphia, Pennsylvania, USA., Cabeen RP; Laboratory of Neuro Imaging (LONI), USC Stevens Neuroimaging and Informatics Institute, Los Angeles, California, USA., Toga AW; Laboratory of Neuro Imaging (LONI), USC Stevens Neuroimaging and Informatics Institute, Los Angeles, California, USA., Newton AT; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Wasserthal J; Medical Image Computing Group, German Cancer Research Center (DKFZ), Heidelberg, Germany., Neher P; Medical Image Computing Group, German Cancer Research Center (DKFZ), Heidelberg, Germany., Maier-Hein K; Medical Image Computing Group, German Cancer Research Center (DKFZ), Heidelberg, Germany., Savini G; Department of Physics, University of Milan, Milan, Italy., Palesi F; Brain Connectivity Center, C. Mondino National Neurological Institute (EFG), Pavia, Italy., Kaden E; Centre for Medical Image Computing, Department of Computer Science, University College London, London, UK., Wu Y; Institution of Information Processing and Automation, Zhejiang University of Technology (ZUT), Hangzhou, China., He J; Institution of Information Processing and Automation, Zhejiang University of Technology (ZUT), Hangzhou, China., Feng Y; Institution of Information Processing and Automation, Zhejiang University of Technology (ZUT), Hangzhou, China., Paquette M; Sherbrooke Connectivity Imaging Lab (SCIL), Computer Science Department, Université de Sherbrooke, Sherbrooke, Canada., Rheault F; Sherbrooke Connectivity Imaging Lab (SCIL), Computer Science Department, Université de Sherbrooke, Sherbrooke, Canada., Sidhu J; Sherbrooke Connectivity Imaging Lab (SCIL), Computer Science Department, Université de Sherbrooke, Sherbrooke, Canada., Lebel C; Department of Radiology, University of Calgary, Canada., Leemans A; Image Sciences Institute, University Medical Center Utrecht, Utrecht, the Netherlands., Descoteaux M; Sherbrooke Connectivity Imaging Lab (SCIL), Computer Science Department, Université de Sherbrooke, Sherbrooke, Canada., Dyrby TB; Danish Research Centre for Magnetic Resonance, Copenhagen University Hospital, Hvidovre, Denmark., Kang H; Biostatistics, Vanderbilt University, Nashville, Tennessee, USA., Landman BA; Computer Science, Vanderbilt University, Nashville, Tennessee, USA.; Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, Tennessee, USA.
Publikováno v:
Journal of magnetic resonance imaging : JMRI [J Magn Reson Imaging] 2020 Jan; Vol. 51 (1), pp. 234-249. Date of Electronic Publication: 2019 Jun 09.
Autor:
Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA. Electronic address: vishwesh.nath@vanderbilt.edu., Schilling KG; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Hansen CB; Computer Science, Vanderbilt University, Nashville, TN, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, TN, USA., Huo Y; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Lyu I; Computer Science, Vanderbilt University, Nashville, TN, USA., Janve V; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Gao Y; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Stepniewska I; Psychology, Vanderbilt University, Nashville, TN, USA., Anderson AW; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Landman BA; Computer Science, Vanderbilt University, Nashville, TN, USA; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Magnetic resonance imaging [Magn Reson Imaging] 2019 Oct; Vol. 62, pp. 220-227. Date of Electronic Publication: 2019 Jul 16.
Autor:
Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA. Electronic address: Prasanna.Parvathaneni@Vanderbilt.edu., Lyu I; Computer Science, Vanderbilt University, Nashville, TN, USA., Huo Y; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Rogers BP; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA., Schilling KG; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA., Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, TN, USA., Anderson AW; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA., Woodward ND; Department of Psychiatry and Behavioral Sciences, Vanderbilt University, Nashville, TN, USA., Landman BA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA; Computer Science, Vanderbilt University, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA; Department of Psychiatry and Behavioral Sciences, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Magnetic resonance imaging [Magn Reson Imaging] 2019 Sep; Vol. 61, pp. 285-295. Date of Electronic Publication: 2019 May 22.
Autor:
Hainline AE; Biostatistics, Vanderbilt University Medical Center, Nashville, TN, USA., Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA., Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Schilling KG; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Blaber JA; Computer Science, Vanderbilt University, Nashville, TN, USA., Anderson AW; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Kang H; Biostatistics, Vanderbilt University Medical Center, Nashville, TN, USA; Center for Quantitative Sciences, Vanderbilt University Medical Center, Nashville, TN, USA. Electronic address: h.kang@vumc.org., Landman BA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Psychiatry and Behavioral Sciences, Vanderbilt University School of Medicine, TN, USA.
Publikováno v:
Magnetic resonance imaging [Magn Reson Imaging] 2019 Jun; Vol. 59, pp. 130-136. Date of Electronic Publication: 2019 Mar 26.
Autor:
Hansen CB; Computer Science, Vanderbilt University, Nashville, TN, USA. Electronic address: colin.b.hansen@vanderbilt.edu., Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, TN, USA., Schilling KG; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA., Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Bayrak RG; Computer Science, Vanderbilt University, Nashville, TN, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Irfanoglu O; National Institute of Biomedical Imaging and Bioengineering, Bethesda, MD, USA., Pierpaoli C; National Institute of Biomedical Imaging and Bioengineering, Bethesda, MD, USA., Anderson AW; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Rogers BP; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Landman BA; Computer Science, Vanderbilt University, Nashville, TN, USA; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Magnetic resonance imaging [Magn Reson Imaging] 2019 Apr; Vol. 57, pp. 133-142. Date of Electronic Publication: 2018 Nov 22.
Autor:
Hansen CB; Computer Science, Vanderbilt University, Nashville, TN, USA., Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, TN, USA., Schilling KG; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN USA., Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Bayrak RG; Computer Science, Vanderbilt University, Nashville, TN, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Williams O; National Institutes of Health, Bethesda, MD., Resnick S; National Institutes of Health, Bethesda, MD., Beason-Held L; National Institutes of Health, Bethesda, MD., Irfanoglu O; National Institute of Biomedical Imaging and Bioengineering, Bethesda MD USA., Pierpaoli C; National Institute of Biomedical Imaging and Bioengineering, Bethesda MD USA., Anderson AW; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN USA.; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN USA., Rogers BP; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN USA.; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN USA., Landman BA; Computer Science, Vanderbilt University, Nashville, TN, USA.; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN USA.; Electrical Engineering, Vanderbilt University, Nashville, TN, USA.; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN USA.
Publikováno v:
Proceedings of SPIE--the International Society for Optical Engineering [Proc SPIE Int Soc Opt Eng] 2019 Mar; Vol. 10948.
Autor:
Bermudez C; Department of Biomedical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Rodriguez W; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Huo Y; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Hainline AE; Department of Biostatistics, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Li R; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Shults R; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., D'Haese PD; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235.; Department of Neurosurgery, Vanderbilt University Medical Center, 2201 West End Ave, Nashville, TN, USA 37235., Konrad PE; Department of Neurosurgery, Vanderbilt University Medical Center, 2201 West End Ave, Nashville, TN, USA 37235., Dawant BM; Department of Biomedical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235.; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235., Landman BA; Department of Biomedical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235.; Department of Electrical Engineering, Vanderbilt University, 2201 West End Ave, Nashville, TN, USA 37235.
Publikováno v:
Proceedings of SPIE--the International Society for Optical Engineering [Proc SPIE Int Soc Opt Eng] 2019 Mar; Vol. 10949.
Autor:
Nath V; EECS, Vanderbilt University, Nashville TN 37203, USA., Parvathaneni P; EECS, Vanderbilt University, Nashville TN 37203, USA., Hansen CB; EECS, Vanderbilt University, Nashville TN 37203, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville TN 37203, USA., Bermudez C; BME, Vanderbilt University, Nashville TN 37203, USA., Remedios S; Computer Science, Middle Tennessee State University, Murfressboro TN 37132, USA., Blaber JA; EECS, Vanderbilt University, Nashville TN 37203, USA., Schilling KG; BME, Vanderbilt University, Nashville TN 37203, USA., Lyu I; EECS, Vanderbilt University, Nashville TN 37203, USA., Janve V; BME, Vanderbilt University, Nashville TN 37203, USA., Gao Y; BME, Vanderbilt University, Nashville TN 37203, USA., Stepniewska I; Psychology, Vanderbilt University, Nashville TN 37203, USA., Rogers BP; VUIIS, Vanderbilt University, Nashville, TN 37232, USA., Newton AT; VUIIS, Vanderbilt University, Nashville, TN 37232, USA., Davis LT; VUMC, Vanderbilt University, Nashville, TN, 37203 USA., Luci J; BME, University of Texas at Austin, Austin, TX 78712., Anderson AW; BME, Vanderbilt University, Nashville TN 37203, USA., Landman BA; EECS, Vanderbilt University, Nashville TN 37203, USA.; BME, Vanderbilt University, Nashville TN 37203, USA.
Publikováno v:
Computational diffusion MRI : MICCAI Workshop [Comput Diffus MRI] 2019; Vol. 2019, pp. 193-201. Date of Electronic Publication: 2019 May 03.
Autor:
Hainline AE; Department of Biostatistics, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Nath V; Department of Computer Science, Vanderbilt University, Nashville, Tennessee, USA., Parvathaneni P; Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Blaber JA; Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Schilling KG; Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Anderson AW; Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Kang H; Department of Biostatistics, Vanderbilt University Medical Center, Nashville, Tennessee, USA.; Center for Quantitative Sciences, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Landman BA; Department of Computer Science, Vanderbilt University, Nashville, Tennessee, USA.; Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, Tennessee, USA.; Center for Quantitative Sciences, Vanderbilt University Medical Center, Nashville, Tennessee, USA.
Publikováno v:
Magnetic resonance in medicine [Magn Reson Med] 2018 Oct; Vol. 80 (4), pp. 1666-1675. Date of Electronic Publication: 2018 Feb 06.
Autor:
Parvathaneni P; Electrical Engineering, Vanderbilt University, Nashville, TN, USA. Electronic address: prasanna.parvathaneni@vanderbilt.edu., Nath V; Computer Science, Vanderbilt University, Nashville, TN, USA., Blaber JA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA., Schilling KG; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA., Hainline AE; Biostatistics, Vanderbilt University, Nashville, TN, USA., Mojahed E; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA; MR Clinical Science, Philips Healthcare, Gainsville, FL, USA., Anderson AW; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA., Landman BA; Electrical Engineering, Vanderbilt University, Nashville, TN, USA; Computer Science, Vanderbilt University, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Magnetic resonance imaging [Magn Reson Imaging] 2018 Jul; Vol. 50, pp. 96-109. Date of Electronic Publication: 2018 Mar 08.