Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Habtom Micael"'
Autor:
Fethi Dhaoui, Patty Liu, Van den Abeelen Werner, Salim Sammie, Habtom Micael, Rich Newell, James Yingbo Jia, Michael Traas, Frank Hawley, John L. McCollum, Pavan Singaraju
Publikováno v:
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
We present a highly reliable Flash based FPGA fabricated with a 65nm embedded process. A very robust ON and OFF Vt window, over 8V, has been achieved with tight cell to cell distributions. 1k program/erase cycles have been performed and charge trap i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b596cd086e1bab6ce9259973872ad8a8
https://doi.org/10.1109/icsict.2012.6466679
https://doi.org/10.1109/icsict.2012.6466679
Autor:
James Yingbo Jia, Salim Sammie, Boon Keat Toh, Li Zhiguo, Fethi Dhaoui, Patty Liu, Pavan Singaraju, Zhao Bing Li, Jing Horng Gau, Yau Kae Sheu, Habtom Micael, Frank Hawley, Tzu-Yun Chang, Ren Chi
Publikováno v:
2012 IEEE International Integrated Reliability Workshop Final Report.
We present studies of an extrinsic program disturb mechanism in a Field Programmable Gate Array (FPGA) fabricated with a 65 nm embedded-Flash process. It is concluded that multiple positive charges are involved during disturb to explain the observed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74ef845cc677085ee8d13fa30c7b1f1b
https://doi.org/10.1109/iirw.2012.6468933
https://doi.org/10.1109/iirw.2012.6468933
Autor:
Michael Traas, Fethi Dhaoui, John L. McCollum, Patty Liu, Salim Sammie, Pavan Singaraju, Esmat Z. Hamdy, Habtom Micael, James Yingbo Jia, Rich Newell, Chenming Hu, Jih-Jong Wang, Van den Abeelen Werner, Frank Hawley
Publikováno v:
2011 IEEE International Integrated Reliability Workshop Final Report.
We present a study of the disturb mechanism encountered in a novel user verify technique that can be used to enhance the security of a Field Programmable Gate Array (FPGA) fabricated with a 65 nm embedded-Flash process. Two disturb mechanisms are stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae6b25ae22c57571929528f346ddf58c
https://doi.org/10.1109/iirw.2011.6142586
https://doi.org/10.1109/iirw.2011.6142586