Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Haas, O de"'
Autor:
Rikel, M.O., Isfort, D., Klein, M., Ehrenberg, J., Bock, J., Specht, E.D., Sun-Wagener, M., Weber, O., Sporn, D., Engel, S., Haas, O. de, Semerad, R., Schubert, M., Holzapfel, B.
A procedure is developed for assessing the epitaxy of La2-xZr2+xO7 (LZO) layers on NiW RABITS. Comparing XRD patterns (theta-2 theta scans and 2D rocking curves) of LZO films of known thickness (ellipsometry or reflectometry measurements) with those
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::4b2ecb2c10a506cc533d7610b1c7f856
https://publica.fraunhofer.de/handle/publica/219202
https://publica.fraunhofer.de/handle/publica/219202
Autor:
Schneider, C M, Haas, O de, Tietjen, D, Muschiol, U, Cramer, N, Celinski, Z, Oelsner, A, Klais, M, Ziethen, Ch, Schmidt, O, Schönhense, G, Zema, N, Zennaro, S
Publikováno v:
Journal of Physics D: Applied Physics; October 21, 2002, Vol. 35 Issue: 20 p2472-2478, 7p
Autor:
Schneider, C. M., Haas, O. de, Muschiol, U., Cramer, N., Oelsner, A., Klais, M., Schmidt, O., Fecher, G. H., Jark, W., Schonhense, G.
Publikováno v:
Journal of Magnetism and Magnetic Materials; 2001, Vol. 233 Issue: 1 p14-20, 7p
Publikováno v:
Journal of Physics: Conference Series; 2006, Vol. 43 Issue 1, p1-1, 1p