Zobrazeno 1 - 10
of 71
pro vyhledávání: '"Haaf, A. ten"'
The energy distribution of an ultracold rubidium ion beam, which is intended to be used as the source for a focused ion beam instrument, is measured with a retarding field analyzer. The ions are created from a laser-cooled and compressed atomic beam
Externí odkaz:
http://arxiv.org/abs/1710.11477
Publikováno v:
Phys. Rev. A 96, 053412 (2017)
A two-step photoionization strategy of an ultracold rubidium beam for application in a focused ion beam instrument is analyzed and implemented. In this strategy the atomic beam is partly selected with an aperture after which the transmitted atoms are
Externí odkaz:
http://arxiv.org/abs/1708.01933
Autor:
Haaf, G. ten, de Raadt, T. C. H., Offermans, G. P., van Rens, J. F. M., Mutsaers, P. H. A., Vredenbregt, E. J. D., Wouters, S. H. W.
Publikováno v:
Phys. Rev. Applied 7, 054013 (2017)
An atomic rubidium beam formed in a 70 mm long two-dimensional magneto-optical trap (2D MOT), directly loaded from a collimated Knudsen source, is analyzed using laser-induced fluorescence. The longitudinal velocity distribution, the transverse tempe
Externí odkaz:
http://arxiv.org/abs/1612.01883
In this paper we discuss the design and performance of a collimated Knudsen source which has the benefit of a simple design over recirculating sources. Measurements of the flux, transverse velocity distribution and brightness at different temperature
Externí odkaz:
http://arxiv.org/abs/1511.07790
Akademický článek
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Autor:
Haaf, G. ten, Wouters, S. H. W., van der Geer, S. B., Vredenbregt, E. J. D., Mutsaers, P. H. A.
Publikováno v:
J. Appl. Phys. 116, 244301 (2014)
Focused ion beams are indispensable tools in the semiconductor industry because of their ability to image and modify structures at the nanometer length scale. Here we report on performance predictions of a new type of focused ion beam based on photo-
Externí odkaz:
http://arxiv.org/abs/1410.4362
Autor:
Wouters, S. H. W., Haaf, G. ten, Notermans, R. P. M. J. W., Debernardi, N., Mutsaers, P. H. A., Luiten, O. J., Vredenbregt, E. J. D.
Photo-ionization of a laser-cooled and compressed atomic beam from a high-flux thermal source can be used to create a high-brightness ion beam for use in Focus Ion Beam (FIB) instruments. Here we show using calculations and Doppler cooling simulation
Externí odkaz:
http://arxiv.org/abs/1410.4350
Publikováno v:
European Journal of Epidemiology, 2016 Jan 01. 31(11), 1067-1068.
Externí odkaz:
https://www.jstor.org/stable/44849494
Autor:
Arntz, Arnoud, Haaf, José ten
Publikováno v:
In Behaviour Research and Therapy November 2012 50(11):707-718
Autor:
O'Dowd, Emma L., Haaf, Kevin ten, Kaur, Jaspreet, Duffy, Stephen W., Hamilton, William, Hubbard, Richard B., Field, John K., Callister, Matthew E. J., Janes, Sam M., de Koning, Harry J., Rawlinson, Janette, Baldwin, David R., Ten Haaf, Kevin, Callister, Matthew Ej
Publikováno v:
Thorax; Sep2022, Vol. 77 Issue 9, p882-890, 9p