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Publikováno v:
2021 IEEE 71st Electronic Components and Technology Conference (ECTC).
Growth in the usage of heterogenous integration and chiplets-based designs in modern advanced packages for leading applications like AI and HPC is driving the need for very large chip sizes that exceed the dimensions of a single back-end stepper expo
Autor:
Le, Diep Ngoc, Nguyen, Ha Ai Phan, Ngoc, Dang Tran, Do, Thuong Hoai Thi, Ton, Nghia Tuan, Van Le, Tuan, Ho, Tinh Huu, Van Dang, Chinh, Thai, Phong K., Phung, Dung
Publikováno v:
Environmental Science & Pollution Research; Dec2022, Vol. 29 Issue 60, p91165-91175, 11p
Publikováno v:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
Wafer-level packaging with high density fan-out (HDFO) requires multiple redistribution layers (RDL) to handle the high-density interconnections and the large data transfer rates between chips in the package. Decreasing the critical dimension (CD) of
Autor:
Ambarish Vaidyanathan, Armistead G. Russell, M. Talat Odman, Scott L. Goodrick, Yongtao Hu, Ha Ai
Publikováno v:
Springer Proceedings in Complexity ISBN: 9783030220549
The HiRes-2 system, operational since 2015, provides daily forecasts of potential prescribed fire impacts on air quality. The system uses the WRF and CMAQ models for meteorology and air quality computations. A decision tree model predicts prescribed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee93a9b07492ddb2d0fac3ca4ae8f487
https://doi.org/10.1007/978-3-030-22055-6_36
https://doi.org/10.1007/978-3-030-22055-6_36
Autor:
Andy Miller, Akito Hiro, Romain Ridremont, John Slabbekoorn, Samuel Suhard, Robert Hsieh, Warren W. Flack, Ha-Ai Nguyen
Publikováno v:
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC).
This study investigates creation of $1.0 \mu \mathrm{m}$ RDL structures by a damascene process utilizing a photosensitive permanent dielectric material. The advantage of the photosensitive dielectric approach is that the Cu overburden removal does no
Publikováno v:
2017 ASEE Annual Conference & Exposition Proceedings.
Publikováno v:
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC).
Fan-Out wafer level packaging has seen rapid adoption over the last few years due to its form factor, performance, and cost advantages compared to 3D packaging techniques. Redistribution layers (RDL) are used to route the very high density connection
Publikováno v:
Proceedings of SPIE.