Zobrazeno 1 - 10
of 87
pro vyhledávání: '"H.S. Reehal"'
Autor:
J. Ball, H.S. Reehal
Publikováno v:
Thin Solid Films. 520:2467-2473
The Au catalysed, vapour–liquid–solid growth of Si nanowires on Si substrates of different orientations has been studied using electron cyclotron resonance plasma-assisted chemical vapour deposition (ECRCVD). ECRCVD plasma excitation is found to
Autor:
G. D. K. Mahanama, H.S. Reehal
Publikováno v:
Vacuum. 86:178-183
The passivation of crystalline Si solar cells using nitrous oxide (N 2 O) electron cyclotron resonance (ECR) plasma discharges has been studied and compared with ECR hydrogen passivation. The cells consisted of ECRCVD grown microcrystalline Si emitte
Publikováno v:
Solar Energy Materials and Solar Cells. 93:1978-1985
Silver nanoparticles have been fabricated on glass and silicon substrates, and silicon solar cells, by evaporation of 10 nm layers followed by thermal annealing. Distinct localized surface plasmon resonances are observed in the optical spectra of the
Publikováno v:
Journal of Crystal Growth. 299:309-315
This work reports on the low temperature ( ⩽ 550 ∘ C ) epitaxial growth of Si films on polycrystalline seed layers made by aluminium-induced crystallisation (AIC) on glass. The seed layers were chemically mechanically polished before use and elec
Autor:
G. Ekanayake, H.S. Reehal
Publikováno v:
Vacuum. 81:272-278
Al-induced crystallisation of microcrystalline Si thin films prepared by electron cyclotron resonance plasma-enhanced chemical vapour deposition (ECR–PECVD) on glass and SiO 2 coated Si wafers has been studied. The starting structure was substrate/
Publikováno v:
Journal of Crystal Growth. 293:351-358
Al-induced crystallisation of microcrystalline Si (μc-Si:H) thin films prepared by electron cyclotron resonance plasma-enhanced chemical vapour deposition (ECR-PECVD) on SiO 2 -coated Si wafers has been studied. The starting structure was substrate/
Autor:
H.S. Reehal, Stefan Gall, I. Sieber, J. Klein, Jens Schneider, T. Quinn, Walther Fuhs, M. Muske, Andrey Sarikov
Publikováno v:
Journal of Crystal Growth. 287:423-427
In the aluminum-induced layer exchange process polycrystalline silicon thin films can be formed on foreign substrates at low temperatures. These films exhibit a preferential (1 0 0) crystal orientation, that depends on the annealing temperature. Furt
Autor:
G. D. K. Mahanama, H.S. Reehal
Publikováno v:
International Journal of Electronics. 92:525-537
The dark and illuminated I–V characteristics of simple, p–n junction crystalline silicon solar cells having microcrystalline or epitaxial emitters have been studied at various temperatures. Low temperature (
Autor:
Nandu B. Chaure, Shweta Chaure, Aseel Hassan, Rifat Capan, Asim K. Ray, A. Ghermazion, H.S. Reehal
Publikováno v:
Vacuum. 77:231-235
X-ray diffraction, atomic force microscopy and electrical studies were performed on 2–3 μm thick diamond films on silicon substrates. The films were produced by the microwave plasma chemical vapour deposition method. The films were polycrystalline
Publikováno v:
Surface and Coatings Technology. 135:126-138
Diamond coatings up to ∼60-μm thick have been grown by microwave plasma CVD (MPCVD) on sintered tungsten carbide (WC) substrates, and their erosive wear properties are investigated under high velocity air–sand erosion testing. Two different sint