Zobrazeno 1 - 10
of 213
pro vyhledávání: '"H.G. Kerkhoff"'
Autor:
N. Engin, H.G. Kerkhoff
Publikováno v:
IEEE Design & Test of Computers. 20:40-47
A new method of transient fault simulation uses dc bias grouping of faulty circuits and decreases the number of Newton-Raphson iterations needed to reach a solution. An experimental tool implementing this method achieves a speedup of 20% to 30% on a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fde4b306cf42473b6c803c83067ed9a3
https://doi.org/10.1109/mdt.2003.1188261
https://doi.org/10.1109/mdt.2003.1188261
Publikováno v:
IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008, 1-7
STARTPAGE=1;ENDPAGE=7;TITLE=IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008
STARTPAGE=1;ENDPAGE=7;TITLE=IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008
—Efficient droplet routing is one of the key approaches for realizing fault-tolerant microfluidic biochips. It requires that run-time diagnosis and fault recovery can be made possible in such systems. This paper describes a droplet routing techniqu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10340f70d9288c95f431bd64f86b4a09
https://doi.org/10.1109/ims3tw.2008.4581596
https://doi.org/10.1109/ims3tw.2008.4581596
Publikováno v:
IEEE European Test Workshop, 2001..
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::333a7ce6af90cb730b0854b15602f455
https://doi.org/10.1109/etw.2001.946673
https://doi.org/10.1109/etw.2001.946673
Autor:
O. Petre, H.G. Kerkhoff
Publikováno v:
ETW
In the next few years, the well-known synchronous design style will not be able to keep pace with the increase of speed and capabilities of integration of advanced processes. Asynchronous design will become more and more common among digital designs,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b38c82cc2f6c025689116835e7c62181
https://doi.org/10.1109/etw.2003.1231667
https://doi.org/10.1109/etw.2003.1231667
Autor:
H.G. Kerkhoff, R.P. Llopis
Publikováno v:
[Proceedings] 1992 IEEE International Symposium on Circuits and Systems.
A performance-driven microcell compiler for sea-of-gates arrays is proposed. This compiler is responsible for the generation of the layout of small logical cells in a semicustom environment. One part of this compiler, the topology generator, is descr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90819f62dc7d012985a982da8fce3d8b
https://doi.org/10.1109/iscas.1992.230692
https://doi.org/10.1109/iscas.1992.230692
Autor:
H.G. Kerkhoff, R.J.H. Koopman
Publikováno v:
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems.
The authors describe an efficient and flexible CMOS sea-of-gates architecture for digital applications. This architecture supports the design of integrated circuits at all important physical design areas such as performance, implementation, and wirin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04f70e07f69b8424aa5eece2d8016946
https://doi.org/10.1109/mwscas.1992.271080
https://doi.org/10.1109/mwscas.1992.271080
Autor:
R.J.H. Koopman, H.G. Kerkhoff
Publikováno v:
[Proceedings] 1992 IEEE International Symposium on Circuits and Systems.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f9f57f291f653dcdc182ca932bb4c36
https://doi.org/10.1109/iscas.1992.230696
https://doi.org/10.1109/iscas.1992.230696
Autor:
R.P. Llopis, H.G. Kerkhoff
Publikováno v:
Proceedings EURO-DAC '92: European Design Automation Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdbc92bb4c7e7b978b5a7e7f1433b8d8
https://doi.org/10.1109/eurdac.1992.246211
https://doi.org/10.1109/eurdac.1992.246211
Publikováno v:
Proceedings of 17th International Conference of the Engineering in Medicine and Biology Society (EMBS), 2, 1103-1104
Presents a Gate Array for implementing electronic circuitry to control multi-electrode arrays, which consist of 128 microelectrodes. The chip contains multiplexers, current sources and buffer amplifiers in CMOS technology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef993ddc118c205715efd946697e5d70
https://doi.org/10.1109/iembs.1995.579533
https://doi.org/10.1109/iembs.1995.579533
Publikováno v:
30th Annual Proceedings Reliability Physics 1992, 247-250
STARTPAGE=247;ENDPAGE=250;TITLE=30th Annual Proceedings Reliability Physics 1992
STARTPAGE=247;ENDPAGE=250;TITLE=30th Annual Proceedings Reliability Physics 1992
A test circuit for electromigration reliability measurements was designed and tested. The device under test (DUT) is a via-hole chain. The test circuit permits simultaneous measurements of a number of DUTs, and a fatal error of one DUT does not influ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2af4c6a17d88760498929f73a68a295e
https://doi.org/10.1109/relphy.1992.187653
https://doi.org/10.1109/relphy.1992.187653