Zobrazeno 1 - 10
of 90
pro vyhledávání: '"H.-J. Steiner"'
Publikováno v:
Advances in Radio Science, Vol 18, Pp 17-22 (2020)
Near-field measurements are commonly performed in anechoic chambers which limits the flexibility of the measurements and requires high precision equipment to achieve exact results. In this contribution, we investigate a simple near-field measurement
Externí odkaz:
https://doaj.org/article/a0d7776fa2554dd481c46b665add3847
Autor:
F. T. Faul, J. Kornprobst, T. Fritzel, H.-J. Steiner, R. Strauß, A. Weiß, R. Geise, T. F. Eibert
Publikováno v:
Advances in Radio Science, Vol 17, Pp 83-89 (2019)
Near-field far-field transformations (NFFFTs) are commonly performed for time-harmonic fields. Considering arbitrary in-situ measurement scenarios with given transmission signals, time-varying aspects of modulated signals have to be taken into consid
Externí odkaz:
https://doaj.org/article/09b1cb1ca4fe4c078ff5d85b7a81bae4
Akademický článek
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Publikováno v:
2021 IEEE Conference on Antenna Measurements & Applications (CAMA).
Autor:
A. Böhm, H. J. Steiner
Publikováno v:
BHM Berg- und Hüttenmännische Monatshefte. 150:199-206
Eingehende Zustandsanalysen betrieblicher Trocknungsanlagen bieten die Moglichkeit zum Erkennen von Verbesserungspotenzialen und zur Ermittlung wirklichkeitsnaher Parameterbetrage fur theoretisch fundierte Planungsmodelle. Behandelt wird die Zustands
Publikováno v:
BHM Berg- und Hüttenmännische Monatshefte. 150:17-28
Einfuhrung — Entwicklung von Zahl, Art und Anteil bergbaubezogener Publikationen — Autoren — Besonderheiten von Forschung und Entwicklung im Bergbau und der damit verbundenen Veroffentlichungen — Allgemeines zu den Veroffentlichungen zwischen
Growth and morphology of SnPc films on the S-GaAs(001) surface: a combined XPS, AFM and NEXAFS study
Autor:
I.T. McGovern, Javier Méndez, A. R. Vearey-Roberts, S. O’Brien, I Cerrillo, H. J. Steiner, Stephen D. Evans, Gregory Cabailh, D. A. Evans, Justin W. Wells
Publikováno v:
Applied Surface Science. 234:131-137
The morphology and molecular ordering of the organic semiconductor tin phthalocyanine (SnPc) on the sulphur-terminated GaAs(0 0 1) surface have been monitored by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and near-edge X-ra
Autor:
Tim Jones, Thorsten U. Kampen, Stephen D. Evans, H. J. Steiner, I.T. McGovern, D. A. Evans, Gregory Cabailh, Sunggook Park, Dietrich R. T. Zahn, R. Middleton
Publikováno v:
Journal of Physics: Condensed Matter
Journal of Physics: Condensed Matter, IOP Publishing, 2003, 15 (38), pp.S2729-S2740. ⟨10.1088/0953-8984/15/38/011⟩
Journal of Physics: Condensed Matter, IOP Publishing, 2003, 15 (38), pp.S2729-S2740. ⟨10.1088/0953-8984/15/38/011⟩
Copper phthalocyanine on InSb(111)A—interface bonding, growth mode and energy band alignment, D.A. Evans, H.J. Steiner, S. Evans, R. Middleton, T.S. Jones, S. Park, T.U. Kampen, D.R.T. Zahn, G. Cabailh and I.T. McGovern, J. Phys.: Condens. Matter,
Autor:
A. R. Vearey-Roberts, Sunggook Park, I.T. McGovern, Wolfgang Braun, D. A. Evans, Vin Dhanak, S. O’Brien, Thorsten U. Kampen, H. J. Steiner, Gregory Cabailh, Dietrich R. T. Zahn
Publikováno v:
Applied Surface Science
Applied Surface Science, Elsevier, 2003, 212-213, pp.417-422. ⟨10.1016/S0169-4332(03)00467-7⟩
Applied Surface Science, Elsevier, 2003, 212-213, pp.417-422. ⟨10.1016/S0169-4332(03)00467-7⟩
The growth of perylenes and phthalocyanines on chalcogen-passivated (0 0 1) surfaces of GaAs has been studied using photoelectron spectroscopy. 3,4,9,10-Perylenetetracarboxylic dianhydride (PTCDA) and copper phthalocyanine (CuPc) form abrupt interfac
Autor:
H. J. Steiner, D. A. Evans, D. Batchelor, A. Bushell, Thorsten U. Kampen, Gregory Cabailh, A. R. Vearey-Roberts, Vin Dhanak, I.T. McGovern, Dietrich R. T. Zahn, Justin W. Wells, S. O’Brien
Publikováno v:
ResearcherID
Organic semiconductors (polymers and small molecules) are widely used in electronic and optoelectronic technologies. Many devices are based on multilayer structures where interfaces play a central role in device performance and where inorganic semico