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pro vyhledávání: '"H. Tunç Çiftçi"'
Autor:
H. Tunç Çiftçi, Michael Verhage, Tamar Cromwijk, Laurent Pham Van, Bert Koopmans, Kees Flipse, Oleg Kurnosikov
Publikováno v:
Microsystems & Nanoengineering, Vol 8, Iss 1, Pp 1-11 (2022)
Abstract We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced “tip-on-chip” probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm2 drastically
Externí odkaz:
https://doaj.org/article/a51f1ba7bac8448bb9be014fe9356284