Zobrazeno 1 - 10
of 26
pro vyhledávání: '"H. Shinkawata"'
Autor:
K. Maekawa, H. Makiyama, Y. Yamamoto, Y. Omizu, H. Yamakoshi, K. Sonoda, H. Yanagita, H. Shinkawata, T. Hashimoto, Yasuo Yamaguchi, Tomohiro Yamashita
Publikováno v:
Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e48063c5b03854193c043cddb38086d
https://doi.org/10.7567/ssdm.2018.b-7-06
https://doi.org/10.7567/ssdm.2018.b-7-06
Autor:
K. Maekawa, H. Makiyama, Y. Yamamoto, T. Hasegawa, S. Okanishi, K. Sonoda, H. Shinkawata, T. Yamashita, S. Kamohara, Y. Yamaguchi
Publikováno v:
Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b34d5af98b5a68818bd7f237dd02dfa7
https://doi.org/10.7567/ssdm.2017.e-1-02
https://doi.org/10.7567/ssdm.2017.e-1-02
Autor:
H. Matsuoka, Atsushi Hachisuka, Hideyuki Noda, K. Shigeta, Kenji Anami, Fukashi Morishita, Isamu Hayashi, A. Amo, M. Niiro, M. Okamoto, T. Gyohten, Tatsuo Kasaoka, Katsumi Dosaka, K. Takahashi, Kazutami Arimoto, H. Shinkawata, T. Yoshihara, K. Fujishima
Publikováno v:
IEEE Journal of Solid-State Circuits. 40:204-212
An embedded DRAM macro with a self-adjustable timing control (STC) scheme, a negative edge transmission scheme (NET), and a power-down data retention (PDDR) mode is developed. A 13.98-mm/sup 2/ 16-Mb embedded DRAM macro is fabricated in 0.13 /spl mu/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31bb5c834b4cc5e50f645e3bcab987de
https://doi.org/10.1109/jssc.2004.837986
https://doi.org/10.1109/jssc.2004.837986
Autor:
H. Matsuoka, M. Okamoto, A. Amo, K. Takahashi, Isamu Hayashi, Kazutami Arimoto, Katsumi Dosaka, Tatsuo Kasaoka, Atsushi Hachisuka, K. Shigeta, M. Niiro, Fukashi Morishita, T. Gyohten, H. Shinkawata
Publikováno v:
2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519).
An embedded DRAM macro with self-adjustable timing control and a power-down data retention scheme is described. A 16Mb test chip is fabricated in a 0.13/spl mu/m low-power process and it achieves 312MHz random cycle operation. Data retention power is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d207d19b5590605443348544d0f08fc
https://doi.org/10.1109/isscc.2004.1332664
https://doi.org/10.1109/isscc.2004.1332664
Autor:
Akihiko Tsuzumitani, Hisashi Ogawa, M. Yoneda, H. Shinkawata, M.K. Mazumder, Keiichiro Kashihara, Yoshihiro Mori, K. Yamada, T. Okudaira, A. Yutani, Yoshikazu Ohno, Y. Tsunemine, H. Itoh, Yasutoshi Okuno
Publikováno v:
Extended Abstracts of the 2003 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af6d312849b7dd1a70c16a104d4fc19d
https://doi.org/10.7567/ssdm.2003.c-4-1
https://doi.org/10.7567/ssdm.2003.c-4-1
Autor:
K. Fukumoto, Takahisa Eimori, Y. Ohno, Takeharu Kuroiwa, H. Shinkawata, T. Nishimura, Hiromi Itoh, T. Okudaira, Teruo Shibano, Tsuyoshi Horikawa, K. Kashihara, Hidenori Miyoshi, Kazutami Arimoto, Y. Hashizume
Publikováno v:
Proceedings of 1994 VLSI Technology Symposium.
The stored charges in the capacitor of the DRAM cell are decreased, as the power supply voltage and the memory cell area are reduced on the trend of the dimension shrinkage. To get sufficient capacitance of memory cell is one of the most important re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::385f03382a1683f28c4c63dee7f86780
https://doi.org/10.1109/vlsit.1994.324413
https://doi.org/10.1109/vlsit.1994.324413
Publikováno v:
Superconductor Science and Technology. 4:229-231
Superconducting films of YBaCuO were fabricated on Ag/MgO substrates by electrophoretic deposition (EPD) and subsequent firing in helium (He) ambience. It has been shown that the firing in He ambience is capable of developing the EPD film in a superc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f8c1599870bd1a08714f9a7fb09e049
https://doi.org/10.1088/0953-2048/4/6/002
https://doi.org/10.1088/0953-2048/4/6/002
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