Macroscopic Model of Arc Roots and its Limits

Autor: J.P. Guillot, André Lefort, M'Hammed Abbaoui, H. Salihou

Publikováno v: High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes, Begell House, 1997, 1, pp.263-272
High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes, 1997, 1, pp.263-272

Experimental study: - low current (2 - 5 A): Ag, Cu, W. - high current (100 - 2000 A): AgNi, AgWC, AgCdO, AgZnO, AgSnO2.; A macroscopic model based on Mackeown's (for the electric field) and Murphy's theories (for electron current density) is used to

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a85e653a22bacc2a8fbc4a060bb8e266
https://hal.archives-ouvertes.fr/hal-00020101

Determination of the power lost by conduction into the cathode at low current arc

Autor: H Salihou, R Auby, André Lefort, M'Hammed Abbaoui

Publikováno v: Journal of Physics D: Applied Physics
Journal of Physics D: Applied Physics, IOP Publishing, 1995, 28, pp.1883-1887. ⟨10.1088/0022-3727/28/9/016⟩
Journal of Physics D: Applied Physics, 1995, 28, pp.1883-1887. ⟨10.1088/0022-3727/28/9/016⟩

The power lost by conduction into copper, silver and tungsten cathodes surrounded by water-cooled brass was determined experimentally. The measurements were made for prolonged short arcs (0.4-1 mm) at low current (2.6-5 A) in argon at 1 atm. The expe

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ea12ceb7573e63675d983f7be100550
https://hal.archives-ouvertes.fr/hal-00019729

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Determination of the Power Balance for Thin Ag–SnO₂ Electrodes Submitted to an Electric Arc Based on IR Thermography.

Autor: Landfried, R., Boukhlifa, M., Houze, F., Leblanc, T., Teste, Ph.

Publikováno v: IEEE Transactions on Components, Packaging & Manufacturing Technology; Oct2022, Vol. 12 Issue 10, p1618-1626, 9p

Contact heating by long arcing during connector disconnection.

Autor: Carvou, E., Ben Jemaa, N., Porte, M., Razafiarivelo, J.

Publikováno v: Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts, 2005; 2005, p360-365, 6p