Zobrazeno 1 - 10
of 29
pro vyhledávání: '"H. Rafla-Yuan"'
Publikováno v:
Surface and Interface Analysis. 30:237-242
The DataFurnace' code, based on the simulated annealing algorithm, was used to extract elemental depth profiles from Rutherford backscattering spectra of 4-layer and 21-layer anti-reflection coatings and a 22-layer narrow-bandpass filter (respectivel
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:3119-3122
We measured the coefficient of linear thermal expansion of ZnSe thin films with a temperature regulated spectroscopic ellipsometer. The change in the film thickness was found to be a quadratic function of temperature whereas the coefficient of linear
Publikováno v:
Journal of The Electrochemical Society. 143:2341-2346
We investigated proton-induced transmittance modulation in amorphous WO 3.2 films with methods of analysis including varia le angle spectroscopic ellipsometry (VASE) and atomic force microscopy (AFM). We induced optical transition from the clear to t
Autor:
H. Rafla‐Yuan, J. F. Cordaro
Publikováno v:
Journal of Applied Physics. 74:4685-4690
The effects on the reflectance spectra of zinc oxide powders, of heat treatment, and of mechanical grinding were investigated for both undoped and aluminum‐doped ZnO. A broad absorptance band at 390–400 nm was induced in the undoped powders both
Autor:
H. Rafla‐Yuan, J. F. Cordaro
Publikováno v:
Journal of Applied Physics. 69:959-964
Changes in the electronic properties of zinc oxide powders doped with aluminum were related to the optical reflectance characteristics. ZnO powders doped as a solid solution, having from 0.035 to 1.00 mol % Al, were characterized. Diffuse optical ref
Autor:
H. Rafla-Yuan, B. P. Hichwa
Publikováno v:
Optical Interference Coatings.
Characterization of the optical and microstructural properties of durable Ag films with Variable Angle Spectroscopic Ellipsometer (VASE) and X-ray Photoelectron Spectroscopy (XPS).
Publikováno v:
Applied Optics. 36:6360
The optical properties of thermally evaporated germanium thin films in the spectral range 0.3-1.7 mum were studied with spectroscopic ellipsometry. The microstructure of these films, including their crystallinity, density, surface morphology, and sur
Autor:
Rafla-Yuan, H., Cordaro, J. F.
Publikováno v:
Journal of Applied Physics; 1/15/1991, Vol. 69 Issue 2, p959, 6p, 2 Charts, 5 Graphs
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