A call for international soil experiment networks for studying, predicting, and managing global change impacts

Autor: M. S. Torn, A. Chabbi, P. Crill, P. J. Hanson, I. A. Janssens, Y. Luo, C. H. Pries, C. Rumpel, M. W. I. Schmidt, J. Six, M. Schrumpf, B. Zhu

Publikováno v: SOIL, Vol 1, Iss 2, Pp 575-582 (2015)

No abstract available.

Externí odkaz: https://doaj.org/article/03c19de48e2047dfaddb5375d433de6b

Core genome multi-locus sequence typing as an essential tool in a high-cost livestock-associated meticillin-resistant Staphylococcus aureus CC398 hospital outbreak

Autor: Henrik Westh, Hans Jørn Kolmos, Michael Kemp, M.L. Slott Jensen, H. Lundgaard, Anette Holm, Annette Toft, Heidi Gumpert, M. Nielsine Skov, H. Pries Kristiansen

Publikováno v: Slott Jensen, M L, Nielsine Skov, M, Pries Kristiansen, H, Toft, A, Lundgaard, H, Gumpert, H, Westh, H, Holm, A, Kolmos, H J & Kemp, M 2020, ' Core genome multi-locus sequence typing as an essential tool in a high-cost livestock-associated meticillin-resistant Staphylococcus aureus CC398 hospital outbreak ', Journal of Hospital Infection, vol. 104, no. 4, pp. 574-581 . https://doi.org/10.1016/j.jhin.2019.12.009

Summary Background Livestock-associated meticillin-resistant Staphylococcus aureus (LA-MRSA) clonal complex (CC) 398 may be transmitted and cause morbidity and mortality in hospitals. The economic cost of stopping hospital transmission of LA-MRSA CC3

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2f96b88b023cb8dcbbe05f73b52ecf97
https://pubmed.ncbi.nlm.nih.gov/31857121

Test Administration

Autor: Kim H. Pries, Jon M. Quigley

Publikováno v: Testing Complex and Embedded Systems ISBN: 9781315169453

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6faa83ddefa4318d96f037a36c899e89
https://doi.org/10.1201/b10470-10

Advanced Concepts

Autor: Kim H. Pries, Jon M. Quigley

Publikováno v: Testing Complex and Embedded Systems ISBN: 9781315169453

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cc835afda3f349f4d9378e52ae6a2989
https://doi.org/10.1201/b10470-11

Span of Tests

Autor: Kim H. Pries, Jon M. Quigley

Publikováno v: Testing Complex and Embedded Systems ISBN: 9781315169453

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::66bb34ff19644efbe7fe11151f74f555
https://doi.org/10.1201/b10470-17