Zobrazeno 1 - 10
of 887
pro vyhledávání: '"H. L. Lung"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
H. Y. Cheng, A. Grun, W C. Chien, C. W. Yeh, A. Ray, C. W. Cheng, E. K. Lai, C. Lavoie, L. Gignac, M. Hopstaken, I. T. Kuo, C. S. Hsu, L. Buzi, R. L. Bruce, D. Y. Lee, N. Gong, D. Bishop, M. BrightSky, H. L. Lung
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Autor:
W. C. Chien, L. M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, C. S. Hsu, D. Daudelin, R. L. Bruce, M. BrightSky, H. L. Lung
Publikováno v:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Autor:
W. C. Chien, L. M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, C. S. Hsu, R. L. Bruce, M. BrightSky, H. L. Lung
Publikováno v:
2022 IEEE International Reliability Physics Symposium (IRPS).
Autor:
H. Y. Cheng, W C. Chien, I. T. Kuo, C. H. Yang, Y. C. Chou, R. L. Bruce, E. K. Lai, D. Daudelin, C. W. Yeh, L. Gignac, C. W. Cheng, A. Grun, C. Lavoie, N. Gong, L. Buzi, H. Y. Ho, A. Ray, H. Utomo, M. BrightSky, H. L. Lung
Publikováno v:
2021 IEEE International Electron Devices Meeting (IEDM).
Publikováno v:
Hong Kong medical journal = Xianggang yi xue za zhi. 25(5)
Publikováno v:
Cancer Gene Therapy. 22:207-214
Many of the cancer cell lines derived from solid tumors are difficult to transfect using commonly established transfection approaches. This hurdle for some DNA transfection systems has hindered cancer biology studies. Moreover, there are limited tool
Autor:
Sung, Ha‐Jun1 (AUTHOR), Choi, Minwoo1 (AUTHOR), Wu, Zhe2 (AUTHOR), Chae, Hwasung2 (AUTHOR), Heo, Sung3 (AUTHOR), Kang, Youngjae1 (AUTHOR), Koo, Bonwon1 (AUTHOR), Park, Jong‐Bong1 (AUTHOR), Yang, Wooyoung1 (AUTHOR), Park, Yongyoung1 (AUTHOR), Ham, Yongnam1 (AUTHOR), Yang, Kiyeon1 (AUTHOR) kiyeon.yang@samsung.com, Lee, Chang Seung1 (AUTHOR) cielolee@samsung.com
Publikováno v:
Advanced Science. Nov2024, Vol. 11 Issue 44, p1-11. 11p.
Autor:
Hur N; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Kim Y; Department of Materials Science and Engineering, Hongik University, Seoul, 04066, Republic of Korea., Park B; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Yoon S; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Kim S; Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Lim DH; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Jeong H; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea.; Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea., Kwon Y; Department of Materials Science and Engineering, Hongik University, Seoul, 04066, Republic of Korea., Suh J; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea.; Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, Republic of Korea.
Publikováno v:
Small methods [Small Methods] 2024 Nov 05, pp. e2401381. Date of Electronic Publication: 2024 Nov 05.