Zobrazeno 1 - 10
of 21
pro vyhledávání: '"H. Kibel"'
Publikováno v:
MRS Advances. 6:445-449
The modified sheet resistance, Rsk, and specific contact resistance, ρc, of Ni-, Pt- and Ti-based contacts to n-type 3C-SiC have been measured using the circular transmission line model (CTLM). The Ni/Pt/Ni/Pt and Pt/Ni contacts have shown a continu
Autor:
Anthony S. Holland, Geoffrey K. Reeves, Mark C Ridgway, Martyn H. Kibel, P. Tanner, Neelu Shrestha, Patrick W. Leech
Publikováno v:
MRS Advances. 2:2903-2908
The electrical characteristics of Au/Ni/Ti/ n-SiC contacts have been examined as a function of implant dose (1013-1014 ions/cm2) at 5 KeV and temperature of annealing (750-1000 °C). Measurements of specific contact resistance, ρc, were approximatel
Autor:
Patrick W. Leech, Geoffrey K. Reeves, Anthony S. Holland, Anders J. Barlow, Martyn H. Kibel, Philip Tanner
Publikováno v:
Microelectronic Engineering. 215:111016
The electrical characteristics of Cr/Ni/Au and Ni/Cr/Au contacts to n-type 3C-SiC have been examined using a two-contact circular test structure. In Ni/Cr/Au contacts with Ni as contact layer and Cr as intermediate layer, both the modified sheet resi
Autor:
Martyn H. Kibel, Patrick W. Leech
Publikováno v:
Surface and Interface Analysis. 24:605-610
This paper describes the characterization by x-ray photoelectron spectroscopy (XPS) of several Ge-doped silica glasses before and after reactive ion etching (RIE) in sulphur hexafluoride (SF 6 ). These glasses have been commonly used in the productio
Publikováno v:
Journal of Applied Physics. 76:4713-4718
The electrical properties of Pd/Zn/Pd/Au ohmic contacts to p‐type In0.47Ga0.53As/InP have been investigated as a function of the ratio of the interfacial Pd and Zn layers and the annealing treatment. For as‐deposited contacts, the presence of an
Autor:
Martyn H. Kibel
Publikováno v:
X-Ray Spectrometry. 19:73-77
The production, properties and structure of II–VI semiconductor materials are topics of increasingly intense research activity. This paper discusses the use of the surface analytical techniques x-ray photoelectron spectroscopy, Auger electron spect
Autor:
Patrick W. Leech, S.R. Glanvill, S. W. Wilkins, C. J. Rossouw, N. Petkovic, J. Thompson, Martyn H. Kibel, M. S. Kwietniak, P. J. Gwynn, Andrew W. Stevenson, T. J. Elms, Geoff N. Pain, D. Gao, T. Warminski, L. S. Wielunski, C. Sandford, N. Bharatula
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1067-1077
Specular HgTe–CdTe superlattice epilayers have been obtained on two 2‐in. diam GaAs or sapphire wafers per growth run using a horizontal metalorganic chemical vapor deposition (MOCVD) reactor in which the pyrolysis of the organometallics is induc
Autor:
M. H. Kibel
Publikováno v:
Springer Series in Surface Sciences ISBN: 9783642074585
Springer Series in Surface Sciences ISBN: 9783662027691
Springer Series in Surface Sciences ISBN: 9783662027691
The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as photoelectron (PE) spectroscopy. This technique can be conveniently divided
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13ad5dbbee2eeb5f6b1fb76d0b8638a6
https://doi.org/10.1007/978-3-662-05227-3_7
https://doi.org/10.1007/978-3-662-05227-3_7
Autor:
Andrew W. Stevenson, Martyn H. Kibel, M. S. Kwietniak, D. G. Hay, Ron S. Dickson, Geoff N. Pain, Glen B. Deacon, Bruce O. West, C. J. Rossouw, G. I. Christiansz, Tadeus Warminski, Katherine McGregor, S.R. Glanvill, R. S. Rowe, N. Bharatula, C. Sandford
Publikováno v:
Journal of Crystal Growth. 101:208-210
The new organometallic feedstock MeMn ( CO ) 5 has been used for the MOCVD growth of Cd 1− x Mn x Te (111B) epilayers on GaAs (100) substrates. The epitaxial relationship was established by HRTEM and X-ray diffraction (XRD). The quaternary alloy Hg
Publikováno v:
MRS Proceedings. 506
The application of a 3-dimensional geoscience information system (GSIS) in the performance assessment of the geological barrier of the nuclear waste disposal site Morsleben is presented. A primary objective is the development of a geometrically consi