Zobrazeno 1 - 10
of 21
pro vyhledávání: '"H. H. Brongersma"'
Publikováno v:
Journal of the American Ceramic Society, 88, 6, pp. 1544-1548
Journal of the American Ceramic Society, 88(6), 1544-1548. Wiley-Blackwell
Journal of the American Ceramic Society, 88, 1544-1548
Journal of the American Ceramic Society, 88(6), 1544-1548. Wiley-Blackwell
Journal of the American Ceramic Society, 88, 1544-1548
The geometry of {001} surfaces of spinel (MgAl2O4) was investigated by first-principles simulations within density-functional theory (DFT). The calculations show that the structure relaxation or reconstruction occurs for a depth of about 0.5 nm. The
Autor:
R. D. van de Grampel, W. Ming, A. Gildenpfennig, W. J. H. van Gennip, J. Laven, J. W. Niemantsverdriet, H. H. Brongersma, G. de With, R. van der Linde
Publikováno v:
Langmuir, 20(15), 6344-6351. American Chemical Society
In this paper, we investigate the surface properties of a series of copolymers of perfluoroalkyl methacrylate (CH2 = C(CH3)COOCH2CnF(2n + 1), n = 1, 6, or 10) and methyl methacrylate (MMA) and of blends of perfluorooctyl-end-capped poly(methyl methac
Autor:
R. D. van de Grampel, W. Ming, A. Gildenpfennig, J. Laven, H. H. Brongersma, G. de With, R. van der Linde
Publikováno v:
Langmuir, 20(1), 145-149. American Chemical Society
The outermost atomic layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Absolute quantification of fluorine density in this layer was achieved after calibrating the fluorine
Autor:
H. H. Brongersma, J. P. Jacobs, S. Boudin, G. Blondiaux, M. Da Cunha Belo, J.-L. Vignes, S. M. Mikhailov, G. Lorang
Publikováno v:
Surface and Interface Analysis, 22(1-12), 462-466. Wiley
Depth composition and chemical states of elements constituting the overlayers of NixCr alloys (x = 0–30 at.%) passivated in borate buffer solutions (pH = 9.2) were determined as a function of the chromium bulk content of the alloy. Depth sputter
Autor:
H. H. BRONGERSMA, G. C. VAN LEERDAM
Publikováno v:
ChemInform. 23
Autor:
V.I.T.A. de Rooij-Lohmann, Frederik Bijkerk, Aart W. Kleyn, Andrey E. Yakshin, H. H. Brongersma
Publikováno v:
Applied physics letters, 94(6). American Institute of Physics
Applied Physics Letters, 94(6):063107. American Institute of Physics
Applied Physics Letters, 94, 3
Applied Physics Letters, 94(6):063107. American Institute of Physics
Applied Physics Letters, 94, 3
An analysis procedure was developed that enables studying diffusion in ultrathin films by utilizing the depth-resolved information that is contained in the background of low energy ion scattering (LEIS) spectra. Using a high-sensitivity analyzer/dete
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::546ea5043c7830a39d21b6e1b4d7d28e
https://research.utwente.nl/en/publications/d2e51a1f-5758-4ada-a745-0aa9f7edb417
https://research.utwente.nl/en/publications/d2e51a1f-5758-4ada-a745-0aa9f7edb417
Publikováno v:
Review of Scientific Instruments, 64(6), 1468-1473. American Institute of Physics
A fast spectroscopic rotating-polarizer ellipsometer has been developed. The machine is equipped with a cascade arc as a light source, a 1024 element linear photodiode array for parallel data processing, and a fast data acquisition interface that all
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c257afe57b962d5be72321bd8be4e6e6
https://research.tue.nl/nl/publications/f2a1845f-a454-43a5-b57e-3c452f4769c1
https://research.tue.nl/nl/publications/f2a1845f-a454-43a5-b57e-3c452f4769c1
Autor:
Enrico G. Keim, Andrey E. Yakshin, Erwin Zoethout, Aart W. Kleyn, Franz Schäfers, H. H. Brongersma, V.I.T.A. de Rooij-Lohmann, M. Gorgoi, Frederik Bijkerk, R. W. E. van de Kruijs
Publikováno v:
Journal of Applied Physics, 108, 5
Journal of Applied Physics, 108(1):014314, 014314/1-014314/5. American Institute of Physics
Journal of Applied Physics, 108(1):014314, 014314/1-014314/5. American Institute of Physics
The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantane
Publikováno v:
Journal of Physics B: Atomic and Molecular Physics. 10:3255-3270
The authors' study is designed to test whether or not existing 'charge transfer to the continuum' theory adequately explains the production of vi approximately=ve electrons resulting from 0.2-0.5 MeV H+ and H2 + ion bombardment of thin carbon foils;