Zobrazeno 1 - 2
of 2
pro vyhledávání: '"H. F. Hillery"'
Autor:
H. A. Six, C. D. Wagner, T. G. Kinisky, H. F. Hillery, D. E. Passoja, J. A. Taylor, W. T. Jansen
Publikováno v:
Journal of Vacuum Science and Technology. 21:933-944
Silicon–oxygen and aluminum–oxygen compounds exhibit significant XPS Auger and photoelectron chemical shifts that are accurately measurable. Chemical state plots of KLL Auger kinetic energy versus 2p photoelectron energy permit identification of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7ec8f5006a2a6ade49f9b65f58a0764
https://doi.org/10.1116/1.571870
https://doi.org/10.1116/1.571870
Publikováno v:
Journal of Crystal Growth. 58:44-52
Silicon on sapphire wafers having visual haze ratings from 1–8 have been characterized by using a variety of techniques, including X-ray rocking curve analysis, X-ray orientation measurements, lattice parameter determination, resistivity measuremen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53ee9b094a3a9ab30107b4caa9fc6bf6
https://doi.org/10.1016/0022-0248(82)90208-1
https://doi.org/10.1016/0022-0248(82)90208-1