Zobrazeno 1 - 10
of 123
pro vyhledávání: '"H. Bubert"'
Publikováno v:
Journal of Non-Crystalline Solids. 354:4363-4366
X-ray photoelectron spectroscopy (XPS) has been used to examine the atomic content of implanted SiO 2 /Si layers. In particular, an XPS analysis permits to identify elemental Ge and Si, as well as GeO 2 precipitations in SiO 2 matrices. The XPS resul
Autor:
Lars Rebohle, M. Bromberek, M. J. Clouter, Halina Krzyzanowska, H. Bubert, Jerzy Żuk, Wolfgang Skorupa
Publikováno v:
Journal of Applied Physics 96(2004)9, 4952-4959
Brillouin scattering and x-ray photoelectron spectroscopy (XPS) have been utilized to characterize Ge+-implanted thermal SiO2 layers on a Si substrate with subsequent annealing at 500 °C and 1100 °C. Sputtering depth profiling in conjunction with X
Publikováno v:
Surface and Coatings Technology. :831-834
Vapour grown carbon fibres were treated in a plasma to enhance the surface energy and thus to improve the bonding to the polymer matrix. To achieve uniform treatment, the fibres were fluidised either by mechanical vibration or in a gas stream (fluidi
Publikováno v:
Diamond and Related Materials. 12:811-815
The overall adhesion of carbon nanotubes to the surrounding matrix in polymer based composite materials was improved by forming polar groups on their surfaces and by modifying the surface morphology. For this, two kinds of low-pressure plasma reactor
Publikováno v:
Analytical and Bioanalytical Chemistry. 374:1237-1241
As-grown and heat-treated vapour grown carbon fibres (VGCF) in the as-prepared state, washed in HCl/H(2)O, and treated in O(2) plasma for different periods have been investigated by means of XPS and scanning electron microscopy (SEM). The surface ene
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 57:1593-1599
Several different methods of thin-layer analysis have been applied to depth profiling of the same sample on the nanometer scale: two variants of Monte Carlo simulations, X-ray photoelectron spectrometry (XPS) with sputtering, sputtered neutrals mass
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 57:1601-1610
The background of the present investigation is to enhance the overall adherence of vapor grown carbon fibers (VGCF) to the surrounding polymer matrix in different applications by forming polar groups at their surfaces and by modifying the surface mor
Publikováno v:
Archaeometry. 41:311-320
A collection of 218 Roman imperial silver coins, covering three centuries, was analysed non-destructively by two variants of X-ray spectral analysis. Electron beam excitation and energy-dispersive spectrometry was used for the analysis of the uppermo
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 346:340-345
The apparent enrichment of Cu, Mg, Mn and Si on the surface of Al cast-alloys, as observed by means of glow discharge optical emission spectrometry (GDOS), could be attributed to the heterogeneous distribution of the alloying elements. The samples un
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 341:241-244
Silicon samples of well-known nickel content have been produced by ion implantation in the dose range from 1017 to 1018 Ni/cm2. Such implants are used for the comparison of different approaches for quantitative Auger electron analysis. Considerable d