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Publikováno v:
Фізика і хімія твердого тіла, Vol 20, Iss 4, Pp 367-371 (2020)
The optical constants and thickness of cadmium chalcogenides (CdX, X= S, Se and Te) thin films prepared by quasi close-space sublimation and high-frequency magnetron sputtering method are determined. The optical constants and the band gap of the film
Externí odkaz:
https://doaj.org/article/847557ec4ff74c49836d278ec0c72bf3