Zobrazeno 1 - 10
of 172
pro vyhledávání: '"H-E. Nilsson"'
Publikováno v:
IEEE Sensors Journal. 11:3009-3018
In this work, a two-chip battery assisted Radio Frequency Identification (RFID) based sensor platform is presented. The radio frequency communication interface is based on the EPC Gen 2 standard. A laboratory setup of the platform has been shown and
Publikováno v:
IEEE Sensors Journal. 8:2044-2052
In the infrared region of the spectrum thermoelectric detectors such as the thermopile are extensively used. These detectors rely on the well-known Seebeck effect, in which there is a direct conversion of thermoelectric differentials into electrical
Publikováno v:
IEEE Transactions on Antennas and Propagation. 55:2709-2717
We address the question of robustness of damaged microstrip antennas, the damage being either penetrating, caused by fragment impact, or floating, caused by manufacturing imperfections. A simple analytic expression is derived to facilitate the predic
Autor:
C. Thaning, H.‐E. Nilsson
Publikováno v:
Journal of Phytopathology. 148:627-631
Three Swedish and one Canadian isolate of Sclerotinia sclerotiorum were tested for apothecial formation in light of different wavelengths and for measuring light absorbance of macerated apothecia and apothecia filtrate in a spectrophotometer. The apo
Autor:
H. E. Nilsson
Publikováno v:
International Journal of Remote Sensing. 12:545-557
Experiments using hand-held instruments for remote sensing of field plots of agricultural crop plants demonstrated good correlation between spectral reflectance data and plant growth, green biomass and yield as well as infection by various leaf and r
Publikováno v:
2006 5th IEEE Conference on Sensors.
Here is presented a concept of a compact optical Fourier-transform spectrometer (FT) working in a wide spectral range in real time and containing no moving parts. Most of the existing FT spectrometers consist of optics to create an image of the inter
Akademický článek
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Publikováno v:
2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515).
Publikováno v:
Simulation of Semiconductor Processes and Devices 2001 ISBN: 9783709172780
In a traditional Monte Carlo (MC) model the carrier preserves its band identity during the free flight between scatterings. However, this assumption may not be valid in semiconductor materials with complex unit cell. A new model is needed where the t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80a7df3d2fce9de3b62d94cc9eac6b97
https://doi.org/10.1007/978-3-7091-6244-6_46
https://doi.org/10.1007/978-3-7091-6244-6_46