Zobrazeno 1 - 10 of 75 pro vyhledávání: '"H W, WERNER"'
3
SIMS: from research to production control
Autor: H. W. Werner
Publikováno v: Surface and Interface Analysis. 35:859-879
In 1958, when I joined the Philips Research Laboratories, there were a number of technological problems related to the analysis of solids within Philips that needed analytical support. Because the available (bulk) techniques did not give sufficient r
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4b601cf77c1fce04962775d0b437bf4a
https://doi.org/10.1002/sia.1569
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5
The early days of ECASIA
Autor: H. W. Werner
Publikováno v: Surface and Interface Analysis. 42:445-447
The reasons for the foundation of ECASIA lay far back in the late 50s and 60s of the last century, when material analysis was identical with bulk analysis. With the appearance of surface analytical techniques such as SIMS and AES, the importance of s
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c85db584459cc18c56257ce70b7a2c91
https://doi.org/10.1002/sia.3241
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6
Non-destructive analysis of materials and devices by means of scanning acoustic microscopy
Autor: J. van Oijen, J. H. M. van den Berg, H. W. Werner
Publikováno v: Analytica Chimica Acta. 297:73-86
The position of scanning acoustic microscopy (SCAM) in the context of destructive versus non-destructive analytical techniques is discussed. The principle of SCAM is touched briefly to a level which will allow an understanding of the various examples
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b9db21f4d7f987c3472eb0b651d1992e
https://doi.org/10.1016/0003-2670(93)e0709-g
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