Zobrazeno 1 - 7
of 7
pro vyhledávání: '"H T Johnson-Steigelman"'
Autor:
R. Fung, S. S. Parihar, H. T. Johnson-Steigelman, Dilano K. Saldin, Paul F. Lyman, V. L. Shneerson
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 63:239-250
The discovery that the phase problem of diffraction from non-periodic objects may be solved by oversampling the diffraction intensities in reciprocal space with respect to a Nyquist criterion has opened up new vistas for structure determination by di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e590eeb289b388f86ebb18bbe87fd52
https://doi.org/10.1107/s0108767307002930
https://doi.org/10.1107/s0108767307002930
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:1218-1222
The formation of hafnium silicate films (HfSixOy) for use as gate oxides with a large dielectric constant by solid-state reaction of Hf metal and SiO2 was investigated. Thin, fully reacted silicate films could be formed, and were thermally stable in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff0d9a545b7769ac727d63e265ae0a2c
https://doi.org/10.1116/1.2180274
https://doi.org/10.1116/1.2180274
Autor:
S. S. Parihar, Paul F. Lyman, E. D. Lu, V. L. Shneerson, Dilano K. Saldin, H. T. Johnson-Steigelman, R. Fung
Publikováno v:
Surface Science. 600:424-435
Adsorption of 0.5 monolayers (ML) of Sb on the Au(1 1 0) surface resulted in the formation of a c(2 x 2) surface reconstruction. Analysis of surface X-ray diffraction data by a direct method revealed the existence of an ordered substitutional surface
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d6b477d307af8edf9ba203123f717de
https://doi.org/10.1016/j.susc.2005.11.019
https://doi.org/10.1016/j.susc.2005.11.019
Publikováno v:
Acta crystallographica. Section A, Foundations of crystallography. 63(Pt 3)
The discovery that the phase problem of diffraction from non-periodic objects may be solved by oversampling the diffraction intensities in reciprocal space with respect to a Nyquist criterion has opened up new vistas for structure determination by di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::feea1044fcca2dc144a85423e69f116d
https://pubmed.ncbi.nlm.nih.gov/17435288
https://pubmed.ncbi.nlm.nih.gov/17435288
Publikováno v:
Physical Review B. 69
The solid-state reaction of thick $(\ensuremath{\sim}50\phantom{\rule{0.3em}{0ex}}\text{nm})$ and thin $(\ensuremath{\sim}\text{monolayer})$ films of Hf with cleaned and oxidized $\text{Si}(001)$ substrates was investigated. Upon annealing to $1000\p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bbbe468b4870673fd3bbcc03a6123c5
https://doi.org/10.1103/physrevb.69.235322
https://doi.org/10.1103/physrevb.69.235322
Autor:
M Z Tahar, H T Johnson-Steigelman
Publikováno v:
Journal of Physics: Conference Series. 400:022121
Elemental In and Pb films ranging in thickness from 200?2000 nm have been grown on glass (SiO2) and other substrates using vacuum vapor deposition. Film growth was monitored and controlled by in-situ four-point probe resistance measurements. Samples
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13380285deb4e31ca07eed02bfcbb021
https://doi.org/10.1088/1742-6596/400/2/022121
https://doi.org/10.1088/1742-6596/400/2/022121
Autor:
S. S. Parihar, Paul F. Lyman, V. L. Shneerson, H. T. Johnson-Steigelman, Dilano K. Saldin, Ross Harder, R. Fung
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 64:C109-C109
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ccc268077b4d63bc4c41bfd5e2c638f
https://doi.org/10.1107/s0108767308096505
https://doi.org/10.1107/s0108767308096505