Zobrazeno 1 - 4
of 4
pro vyhledávání: '"H T Haile"'
Autor:
H T Haile, F B Dejene
Publikováno v:
Materials Research Express, Vol 7, Iss 7, p 076406 (2020)
The material properties of Y _2 SiO _5 : Ce ^3+ thin films have been investigated. The X-ray powder diffraction (XRD) analysis shows that the films are structurally monoclinic with the most prominent diffraction peak of 15.7 °. The maximum crystalli
Externí odkaz:
https://doaj.org/article/128d5cf94bf14fd8b50f2622f365a248
Autor:
H. T. Haile, Francis B. Dejene
Publikováno v:
Applied Physics A. 127
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25ebc53651f29ff45f2cffd6e59a1b73
https://doi.org/10.1007/s00339-021-04844-8
https://doi.org/10.1007/s00339-021-04844-8
Autor:
H. T. Haile, Francis B. Dejene
Publikováno v:
Applied Physics A. 125
The effect of the target–substrate distance on the structural, morphological and photoluminescence (PL) properties of the thin film of the Y2SiO5:Ce3+ commercial phosphor studied by the pulsed laser deposition method. The distance between the targe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0573635ed057928f47c1627aac7ce1b
https://doi.org/10.1007/s00339-019-2473-4
https://doi.org/10.1007/s00339-019-2473-4
Autor:
Francis B. Dejene, H. T. Haile
Publikováno v:
Journal of Materials Science: Materials in Electronics. 31:17145-17145
BaAl2O4:Eu2+, Dy3+ thin films have been successfully deposited by pulsed laser deposition (PLD) method. Formation of crystalline phase was confirmed by X-ray diffraction (XRD) measurement. The average crystallite size calculates using the Scherer’s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f3a3b8326cc3cada707d0d27ab2e540
https://doi.org/10.1007/s10854-020-04377-5
https://doi.org/10.1007/s10854-020-04377-5