Zobrazeno 1 - 10
of 367
pro vyhledávání: '"H Noll"'
Publikováno v:
Advanced Modeling and Simulation in Engineering Sciences, Vol 7, Iss 1, Pp 1-33 (2020)
Abstract We propose a hybrid interface preconditioner for the monolithic solution of surface-coupled problems. Powerful preconditioning techniques are crucial when it comes to solving large monolithic systems of linear equations efficiently, especial
Externí odkaz:
https://doaj.org/article/d1fecd6423a54ba7b074fe32222b9817
Publikováno v:
2020 17th European Radar Conference (EuRAD).
Living-object-detection (LOD) in hazardous areas can save lifes and is the key feature of safety critical radar sensors. Suppression of bright and static clutter is needed in order to detect weak echoes from potentially moving living objects. We stud
Autor:
G van Mark, Ralf Barion, Reinhard W. Holl, Thomas Danne, S Badis, Peter Bramlage, Stefanie Lanzinger, Jochen Seufert, H Noll, M Degenhardt
Publikováno v:
Diabetes – Nicht nur eine Typ-Frage – www.diabeteskongress.de.
Publikováno v:
Foot & Ankle International. 23:509-514
To evaluate the use of an immediate postoperative prosthesis (IPOP) for transtibial amputees, we compared patient outcomes from a prospective clinical study of 19 patients managed with an IPOP with those of a retrospective review of a matched histori
Autor:
Kenneth H Noll, Wallace C Beitl
Publikováno v:
Foot and Ankle Clinics. 6:297-314
Custom-made orthotic devices are beneficial as preoperative and postoperative modalities. At the outset of treatment, a combination of casting and bracing may be instituted. The decision to employ a brace or cast is generally determined by the pathol
Publikováno v:
Foot & Ankle International. 22:214-219
We evaluated the ability of seven devices to immobilize a prosthetic ankle-foot complex against plantarflexion, dorsiflexion, inversion, and eversion forces: two casts (plaster of Paris and Fiberglas®) and five removable braces (molded ankle/foot or
Publikováno v:
Applied Physics A: Materials Science & Processing. 66:S999-S1002
Publikováno v:
Surface and Interface Analysis. 25:529-532
The surface topography and structure of low-pressure chemical vapour-deposited silicon films grown on the thermal oxide of (100) silicon substrates have been investigated using atomic force microscopy. The measurements have been performed on undoped
Publikováno v:
Journal of Applied Physics. 81:6749-6753
The surface topography and structure of low-pressure chemical vapor deposited silicon films on thermal oxide grown on (100) silicon substrates have been investigated after different processing steps. Atomic force microscopy topographic measurements a