Zobrazeno 1 - 10
of 98
pro vyhledávání: '"H G Owen"'
Autor:
Ehud Fuchs, James H. G. Owen, Afshin Alipour, Emma L. Fowler, S.O. Reza Moheimani, John N. Randall
Publikováno v:
Novel Patterning Technologies 2023.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::572af1bd5aa0cb241db06b9d90d31658
https://doi.org/10.1117/12.2661599
https://doi.org/10.1117/12.2661599
Autor:
Robert E. Butera, Shashank Misra, Andrew Baczewski, John N. Randall, Steven M. Rinaldi, James H. G. Owen, Ezra Bussmann
Publikováno v:
MRS Bulletin. 46:607-615
A materials synthesis method that we call atomic-precision advanced manufacturing (APAM), which is the only known route to tailor silicon nanoelectronics with full 3D atomic precision, is making an impact as a powerful prototyping tool for quantum co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6d9c33ed6bf3939bfc12ccd5ee675ad
https://doi.org/10.1557/s43577-021-00139-8
https://doi.org/10.1557/s43577-021-00139-8
Publikováno v:
Journal of Vacuum Science & Technology B. 40
In this work, atomic-resolution lithography with a Microelectromechanical-System (MEMS) based Scanning Tunneling Microscope (STM) is demonstrated for the first time. The microscope consists of a commercial UltraHigh-Vacuum (UHV) STM whose regular tip
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffb9db4061bd55d1996f251141ff5998
https://doi.org/10.1116/6.0001826
https://doi.org/10.1116/6.0001826
Autor:
Alexander Reum, Daniel F. Feezell, Stephan Mecholdt, Mahmoud Behzadirad, John N. Randall, Tito Busani, Ashwin K. Rishinaramangalam, Joshua B. Ballard, Teodor Gotszalk, James H. G. Owen, Ivo W. Rangelow
Publikováno v:
Nano letters. 21(13)
A fundamental understanding and advancement of nanopatterning and nanometrology are essential in the future development of nanotechnology, atomic scale manipulation, and quantum technology industries. Scanning probe-based patterning/imaging technique
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e530c15a91feabc97b2e04064928fcba
https://pubmed.ncbi.nlm.nih.gov/34192467
https://pubmed.ncbi.nlm.nih.gov/34192467
Publikováno v:
Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020.
Hydrogen Depassivation Lithography (HDL) is a version of electron beam lithography that uses scanning tunneling microscope (STM) instrumentation to expose a self–developing resist that is a monolayer of H chemisorbed to a Si (100) 2x1 H-passivated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c05ebbbcb8dee32abb5807750b2e31a5
https://doi.org/10.1117/12.2552083
https://doi.org/10.1117/12.2552083
Autor:
Jeffrey A. Ivie, Ezra Bussmann, Quinn Campbell, R Santini, Andrew Baczewski, Scott W. Schmucker, Shashank Misra, John N. Randall, James H. G. Owen
Publikováno v:
Journal of Physics: Condensed Matter. 33:464001
Atomically precise ultradoping of silicon is possible with atomic resists, area-selective surface chemistry, and a limited set of hydride and halide precursor molecules, in a process known as atomic precision advanced manufacturing (APAM). It is desi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2d5c2eeda48d0292c8bd4493bd96b642
https://doi.org/10.1088/1361-648x/ac1ddf
https://doi.org/10.1088/1361-648x/ac1ddf
Publikováno v:
Journal of Vacuum Science & Technology B. 39:040603
In this article, we replace the Z axis of the piezotube of a conventional Ultrahigh-Vacuum (UHV) Scanning Tunneling Microscope (STM) with a one-degree-of-freedom Microelectromechanical-System (MEMS) nanopositioner. As a result, a hybrid system is rea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a947dbabc1f782ed7fd10eb0dc59b2e1
https://doi.org/10.1116/6.0001107
https://doi.org/10.1116/6.0001107
Publikováno v:
Journal of Vacuum Science & Technology B. 39:042802
A scanning tunneling microscope (STM) combines unique capabilities in imaging and spectroscopy with atomic precision, and it can obtain energy-resolved spectroscopic data with atomic resolution. In this paper, we utilize a recently proposed modificat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::895c81e1a50d6d5b479091b63b5ea0fe
https://doi.org/10.1116/6.0001087
https://doi.org/10.1116/6.0001087
Autor:
James H. G. Owen, Wiley P. Kirk
Publikováno v:
2D Quantum Metamaterials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c061c96f480fd68b9a5bfe31149a6641
https://doi.org/10.1142/9789811206061_0005
https://doi.org/10.1142/9789811206061_0005
Exciting developments in strategic areas of science and engineering makes for possible new engineered structures identified as quantum metamaterials. These new structures offer unusual properties that involve fundamental concepts such as entangled qu
