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Publikováno v:
Physical Review B. 47:6981-6989
We present x-ray Si K, Si L, and O K emission bands of hydrogenated amorphous ${\mathrm{SiO}}_{\mathit{x}}$ alloy films covering the concentration range 0\ensuremath{\le}x\ensuremath{\le}2.2. All spectral features in the emission bands were identifie