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pro vyhledávání: '"H D, Le Thi"'
Publikováno v:
Journal of Applied Crystallography. 31:113-120
High-resolution X-ray diffraction is commonly used to measure the misfit strain and to determine the unstrained lattice parameter of epitaxic semiconductor layers assuming tetragonal distortion. In this paper a method is developed which links the mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e83868e3ab8d75d004a19944d73af36
https://doi.org/10.1107/s0021889897006560
https://doi.org/10.1107/s0021889897006560
Publikováno v:
Archives des maladies du coeur et des vaisseaux. 78(11)
The decision to treat patients with high blood pressure depends largely on the level of pressure. However, a major difficulty is the great variability of blood pressure level in any individual patient. From May 1st 84 to July 1st 84, 259 patients wer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::3c684781558421f6f9cdd83250c92cb1
https://pubmed.ncbi.nlm.nih.gov/3938231
https://pubmed.ncbi.nlm.nih.gov/3938231