Zobrazeno 1 - 10
of 38
pro vyhledávání: '"H Caquineau"'
Publikováno v:
AIP Advances, Vol 6, Iss 10, Pp 105111-105111-20 (2016)
Cyclic formation of dust nanoparticles in hexamethyldisiloxane (HMDSO, Si2O(CH3)6)-argon RF discharge with pulsed injection of HMDSO was studied using time-resolved mass spectrometry (MS) and optical emission spectroscopy (OES). A large amount of C2H
Externí odkaz:
https://doaj.org/article/92a7212340e3494e90c7dc9ed78b8e0f
Publikováno v:
Journal of Computational Physics. 281:473-492
We develop a finite volume method based on unstructured triangular and/or quadrangular meshes for the numerical modeling of gas discharges at atmospheric pressure. The discretization of the computational domain is performed with median-dual control-v
Publikováno v:
AIP Advances
AIP Advances, American Institute of Physics-AIP Publishing LLC, 2016, 6 (10), pp.105111. ⟨10.1063/1.4966254⟩
AIP Advances, Vol 6, Iss 10, Pp 105111-105111-20 (2016)
AIP Advances, American Institute of Physics-AIP Publishing LLC, 2016, 6 (10), pp.105111. ⟨10.1063/1.4966254⟩
AIP Advances, Vol 6, Iss 10, Pp 105111-105111-20 (2016)
Cyclic formation of dust nanoparticles in hexamethyldisiloxane (HMDSO, Si2O(CH3)6)-argon RF discharge with pulsed injection of HMDSO was studied using time-resolved mass spectrometry (MS) and optical emission spectroscopy (OES). A large amount of C2H
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bee0c6b75c3991ea4c9e99b052ade566
https://hal.archives-ouvertes.fr/hal-02448285
https://hal.archives-ouvertes.fr/hal-02448285
Publikováno v:
Journal of Physics D: Applied Physics. 40:2045-2054
In this paper, a microscopic approach for the calculation of partial and total power dissipation from energy losses by collisions is considered and applied in the case of N2O low pressure RF discharges. This approach is based on a Monte Carlo techniq
Publikováno v:
Journal of Physics D: Applied Physics. 38:4290-4295
The power dissipation in radiofrequency (RF) discharges in N2O–He mixtures was measured as a function of He dilution in N2O at two different gas pressures and several RF voltages. The maximum of power dissipation as a function of the helium dilutio
Publikováno v:
Thin Solid Films. 471:53-62
Silicon oxide thin films were deposited at low temperatures by Plasma-Enhanced Chemical Vapour Deposition (PECVD) from silane–nitrousoxide (SiH 4 –N 2 O) and silane–nitrous oxide–helium (SiH 4 –N 2 O–He) mixtures. The film structure is sh
Publikováno v:
Polymer Engineering and Science
Polymer Engineering and Science, Wiley-Blackwell, 2003, 43 (4), pp.798-808. ⟨10.1002/pen.10066⟩
Polymer Engineering and Science, Wiley-Blackwell, 2003, 43 (4), pp.798-808. ⟨10.1002/pen.10066⟩
The formation of polymer films produced by the phase separation process occurring when a cast poly(etherimide)/N-Methyl-2-Pyrrolidone solution was exposed to humid air was studied. It was found that above a relative humidity value of 27%, the films p
Akademický článek
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Publikováno v:
Journal of Physics D: Applied Physics. 33:1332-1341
The present work concerns the experimental and theoretical analysis of the electrical behaviour and N2O/SiH4 dissociation of a classical RF discharge used for SiO2 thin-film deposition. Electric and deposition rate measurements are undertaken at 0.5
Publikováno v:
Journal of Physics D: Applied Physics. 32:1478-1488
In situ diagnostic measurements and reactor modelling are used to study the N2O dissociation by radio frequency (RF) discharges. Measurements are undertaken at 0.5 and 1 Torr gas pressure with a RF power density varying from 4.2 to 35.7 mW cm-2. The