Zobrazeno 1 - 10
of 67
pro vyhledávání: '"H A, Mook"'
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2666eb926689de6dd729b1bcf92263d
https://doi.org/10.1201/9781003063056-19
https://doi.org/10.1201/9781003063056-19
Publikováno v:
2019 Electron Devices Technology and Manufacturing Conference (EDTM).
The effect of polysilicon grain size on gate leakage is investigated and the impact on yield is presented. Wafers with larger polysilicon grains show higher yield loss associated with gate leakage. One possible mechanism is that polysilicon with larg
Autor:
H. J. Backer, H. W. Mook
Publikováno v:
Recueil des Travaux Chimiques des Pays-Bas. 47:464-470
Autor:
Adinda Freudenthal, H. J. Mook
Publikováno v:
Cognition, Technology & Work. 5:55-66
Usability trials were carried out with a simulation of an early version of an intelligent thermostat interface. The multimodal interaction dialog took place in speech, sound, graphics and touch. Usability of new concepts of interaction was assessed.
Autor:
R. H. G. Mook
Publikováno v:
Geographica Helvetica, Vol 22, Iss 1, Pp 31-35
An Hand klimatologischer und hydrologischer Daten wird beschrieben, wie der Verlauf des Abflusses im Küstenbereich Nordnorwegens von winterlichen Taufluten bestimmt wird, während im Binnenland die Flüsse im Laufe des Winters hauptsächlich aus See
Externí odkaz:
https://doaj.org/article/1c908f3e684d402ea203550636371c7a
Autor:
M. Hoving, E. A. Hakkennes, I. L. van Mil, H. W. Mook, Marco Jan-Jaco Wieland, V. Kuiper, G. de Boer, C. van den Berg, N. Venema, Thomas Adriaan Ooms, M. Sanderse, J. J. Koning, Remco Jager, Erwin Slot, A. Tudorie, A. Weirsma, A. M. C. Valkering, S. Boschker, T. van de Peut, Bert Jan Kampherbeek, S. Woutersen, Niels Vergeer, S. Postma, P. Scheffers, G. Holgate, Yue Ma
Publikováno v:
Alternative Lithographic Technologies III.
Currently, three MAPPER multi-electron beam lithography tools are operational. Two are located at customers, TSMC and LETI, and one is located at MAPPER. The tools at TSMC and LETI are used for process development. These tools each have 110 parallel
Autor:
G. AEPPLI, P. LITTLEWOOD, S. W. CHEONG, H. A. MOOK, T. E. MASON, K. N. CLAUSEN, S. M. HAYDEN, A. D. TAYLOR, T. G. PERRING, et al. et al.
Publikováno v:
ChemInform. 26
Autor:
G. Aeppli, Sang-Wook Cheong, H. A. Mook, Zachary Fisk, T.E. Mason, Pengcheng Dai, Toby Perring, Stephen M Hayden, Fatih Dogan
Publikováno v:
ChemInform. 29
The authors review recent measurements of the high-frequency dynamic magnetic susceptibility in the high-T{sub c} superconducting systems La{sub 2{minus}x}Sr{sub x}CuO{sub 4} and YBa{sub 2}Cu{sub 3}O{sub 6+x}. Experiments were performed using the cho
Publikováno v:
Physical Review Letters. 68:1414-1417
The general magnetic response function \ensuremath{\chi}(Q,\ensuremath{\omega}) of a superconducting (${\mathit{T}}_{\mathit{c}}$=33 K) single crystal of ${\mathrm{La}}_{1.86}$${\mathrm{Sr}}_{0.14}$${\mathrm{CuO}}_{4}$ is measured using inelastic neu