Zobrazeno 1 - 3
of 3
pro vyhledávání: '"H��nicke, Philipp"'
Autor:
H��nicke, Philipp, Andrle, Anna, Kayser, Yves, Nikolaev, Konstantin V., Probst, J��rgen, Scholze, Frank, Soltwisch, Victor, Weimann, Thomas, Beckhoff, Burkhard
The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor complex processing constraints fabrication, both a dimensional recons
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c2be621b0e942ac4e81caec34be279a1
http://arxiv.org/abs/2005.02078
http://arxiv.org/abs/2005.02078
Autor:
H��nicke, Philipp, Detlefs, Blanka, Kayser, Yves, M��hle, Uwe, Pollakowski, Beatrix, Beckhoff, Burkhard
Nanolayer stacks are technologically very relevant for current and future applications in many fields of research. A non-destructive characterization of such systems is often performed using X-ray reflectometry (XRR). For complex stacks of multiple l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::340e78e41a1cf8082e491d8c4e55cccc
http://arxiv.org/abs/1903.01196
http://arxiv.org/abs/1903.01196
Autor:
H��nicke, Philipp, Kr��mer, Markus, L��hl, Lars, Andrianov, Konstantin, Beckhoff, Burkhard, Dietsch, Rainer, Holz, Thomas, Kanngie��er, Birgit, Wei��bach, Danny, Wilhein, Thomas
With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions, quantific
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0deaeb739008a7a00b0812b63105eaff
http://arxiv.org/abs/1801.04246
http://arxiv.org/abs/1801.04246