Zobrazeno 1 - 10
of 376
pro vyhledávání: '"Högberg, Hans"'
Autor:
Nzulu, Gabriel K., Rogström, Lina, Lu, Jun, Högberg, Hans, Eklund, Per, Hultman, Lars, Magnuson, Martin
Publikováno v:
J. Afr. Earth Sci. 220 105439 (2024)
Altered and gangue quartz in hydrothermal veins from the Kubi Gold deposit in Dunkwa on Offin in the central region of Ghana are investigated for possible Au-associated indicator minerals and to provide the understanding and increase the knowledge of
Externí odkaz:
http://arxiv.org/abs/2410.07828
Autor:
Shanmugham, Sathish Kumar, le Febvrier, Arnaud, Palisaitis, Justinas, Persson, Per O. Å., Frost, Robert J. W., Primetzhofer, Daniel, Petrov, Ivan, Högberg, Hans, Birch, Jens, Rosen, Johanna, Eklund, Per, Nayak, Sanjay
Publikováno v:
Journal of Applied Physics; 9/21/2024, Vol. 136 Issue 11, p1-10, 10p
Publikováno v:
Leadership in Health Services, 2023, Vol. 37, Issue 5, pp. 66-83.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/LHS-01-2023-0004
Publikováno v:
Vacuum 196, 110567 (2022)
We review the thin film growth, chemistry, and physical properties of Group 4-6 transition-metal diboride (TMB2) thin films with AlB2-type crystal structure (Strukturbericht designation C32). Industrial applications are growing rapidly as TMB2 begin
Externí odkaz:
http://arxiv.org/abs/2112.14099
Publikováno v:
Minerals 11, 912 (2021)
X-ray photoelectron spectroscopy (XPS) and energy-dispersive X-ray spectroscopy (EDX) are applied to investigate the properties of fine-grained concentrate on artisanal small-scale gold mining samples from the Kubi Gold Project of the Asante Gold Cor
Externí odkaz:
http://arxiv.org/abs/2110.15758
Publikováno v:
In Results in Materials September 2023 19
Autor:
Magnuson, Martin, Tengdelius, Lina, Eriksson, Fredrik, Samuelsson, Mattias, Broitman, Esteban, Greczynski, Grzegorz, Hultman, Lars, Högberg, Hans
Publikováno v:
Thin Solid Films 688, 137384 (2019)
W-B-C films were deposited on Si(100) substrates held at elevated temperature by reactive sputtering from a W target in Kr/trimethylboron (TMB) plasmas. Quantitative analysis by X-ray photoelectron spectroscopy (XPS) shows that the films are W-rich b
Externí odkaz:
http://arxiv.org/abs/1909.07197
Autor:
Magnusona, Martin, Tengdelius, Lina, Greczynski, Grzegorz, Eriksson, Fredrik, Jensen, Jens, Lu, Jun, Samuelsson, Mattias, Eklund, Per, Hultman, Lars, Högberg, Hans
Publikováno v:
J. Vac. Sci. Technol. A. 37, 021506 (2019)
We investigate sputtering of a Ti3SiC2 compound target at temperatures ranging from RT (no applied external heating) to 970 oC as well as the influence of the sputtering power at 850 oC for the deposition of Ti3SiC2 films on Al2O3(0001) substrates. E
Externí odkaz:
http://arxiv.org/abs/1901.05904
Publikováno v:
Appl. Sulf. Sci. 470, 607-612 (2019)
The electronic structure and chemical bonding of Beta-Ta synthesized as a thin 001-oriented film (space group P421m) is investigated by 4f core level and valence band X-ray photoelectron spectroscopy and compared to alfa-Ta bulk. For the Beta-phase,
Externí odkaz:
http://arxiv.org/abs/1811.10482
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.