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pro vyhledávání: '"Hérnandez, Martín Zumaya"'
Publikováno v:
Phys. Rev. Lett. 124, 088002 (2020)
We introduce a fast spatial point pattern analysis technique which is suitable for systems of many identical particles giving rise to multi-particle correlations up to arbitrary order. The obtained correlation parameters allow to quantify the quality
Externí odkaz:
http://arxiv.org/abs/1910.04244