Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Héritier, Martin"'
Autor:
Gisler, Thomas, Helal, Mohamed, Sabonis, Deividas, Grob, Urs, Héritier, Martin, Degen, Christian L., Ghadimi, Amir H., Eichler, Alexander
We demonstrate that soft-clamped silicon nitride strings with large aspect ratio can be operated at \si{\milli\kelvin} temperatures. The quality factors ($Q$) of two measured devices show consistent dependency on the cryostat temperature, with soft-c
Externí odkaz:
http://arxiv.org/abs/2112.03730
Autor:
Héritier, Martin, Pachlatko, Raphael, Tao, Ye, Abendroth, John M., Degen, Christian L., Eichler, Alexander
Publikováno v:
Phys. Rev. Lett. 127, 216101 (2021)
We report spatially resolved measurements of static and fluctuating electric fields over conductive (Au) and non-conductive (SiO2) surfaces. Using an ultrasensitive `nanoladder' cantilever probe to scan over these surfaces at distances of a few tens
Externí odkaz:
http://arxiv.org/abs/2104.02437
Autor:
Hälg, David, Gisler, Thomas, Tsaturyan, Yeghishe, Catalini, Letizia, Grob, Urs, Krass, Marc-Dominik, Héritier, Martin, Mattiat, Hinrich, Thamm, Ann-Katrin, Schirhagl, Romana, Langman, Eric C., Schliesser, Albert, Degen, Christian L., Eichler, Alexander
Publikováno v:
Phys. Rev. Applied 15, 021001 (2021)
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating a
Externí odkaz:
http://arxiv.org/abs/2006.06238
Autor:
Héritier, Martin
This thesis presents our efforts to improve the sensitivity of scanning probe microscopy, with magnetic resonance force microscopy (MRFM) as the main technique in mind. In MRFM, the sample is placed on a soft cantilever (∼ 200 μNm) which is approa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::21c67b9d4a576b0c24fbb9531683b343
Akademický článek
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Akademický článek
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Autor:
Gisler T; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Helal M; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Sabonis D; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Grob U; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Héritier M; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Degen CL; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland., Ghadimi AH; Centre Suisse d'Electronique et de Microtechnique SA (CSEM), 2002 Neuchâtel, Switzerland., Eichler A; Laboratory for Solid State Physics, ETH Zürich, 8093 Zürich, Switzerland.
Publikováno v:
Physical review letters [Phys Rev Lett] 2022 Sep 02; Vol. 129 (10), pp. 104301.
