Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Gyula Zilahi"'
Publikováno v:
Frontiers in Nuclear Engineering, Vol 2 (2024)
Two-micron thick erbium oxide tritium barrier coatings have been prepared by aerosol injection chemical vapor deposition and subsequently irradiated with 33 MeV Au 6+ ions at fluences up to 2.1 × 1016 Au/m2 at 550°C. Scanning electron microscopy, X
Externí odkaz:
https://doaj.org/article/81c95eefa86649a8904383fe51fcc34d
Autor:
Gergely Farkas, Jishnu Bhattacharyya, Olena Levytska, Gyula Zilahi, Kristián Máthis, Sean R. Agnew
Publikováno v:
Acta Materialia. 233:117993
Autor:
Zoltán Dankházi, Bertalan Jóni, Éva Ódor, Gyula Zilahi, Ildikó Szenthe, István Groma, Zoltán Hózer, Gábor Ribárik
Publikováno v:
Journal of Applied Crystallography
The dislocation microstructure developing during neutron irradiation is determined by X-ray line profile analysis.
During neutron irradiation of metals, owing to the enhanced number of vacancies and interstitial atoms, the climb motion of disloc
During neutron irradiation of metals, owing to the enhanced number of vacancies and interstitial atoms, the climb motion of disloc
Autor:
Xavier Maeder, Péter Dusán Ispánovity, Szilvia Kalácska, Zoltán Dankházi, Johann Michler, Gyula Zilahi, István Groma
Publikováno v:
Materials science and engineering / A Structural materials : properties, microstructure and processing properties, microstructure and processing 770, 138499-(2020). doi:10.1016/j.msea.2019.138499
Materials science and engineering / A Structural materials : properties, microstructure and processing properties, microstructure and processing 770, 138499 - (2020). doi:10.1016/j.msea.2019.138499
Mechanical testing of micropillars is a field t
Mechanical testing of micropillars is a field t
Autor:
Tamás Ungár, Gábor Ribárik, Gyula Zilahi, R.P. Mulay, Sean R. Agnew, Ulrich Lienert, Levente Balogh
Publikováno v:
Acta Materialia. 71:264-282
A novel X-ray diffraction-based technique for grain-by-grain assessment of dislocation density within polycrystals is applied. The technique discriminates dislocation densities of different slip modes, slip systems and dislocation character. Data whi
Publikováno v:
Journal of Applied Physics. 113:033903
The frequency of planar defects, the average dislocation densities, and coherent domain size in epitaxial GdBa2Cu3O7−x high Tc thin films, with altering CuO2 and CuO planes, are measured by fitting full widths at half maximum values of 00l type ref