Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Gyoyoung Jin"'
Autor:
Sung Hwan Kim, Hyun Jun Bae, Chang Woo Oh, Dong-Won Kim, Satoru Yamada, Gyoyoung Jin, Yonghan Roh
Publikováno v:
Japanese Journal of Applied Physics. 51:04DC04
Autor:
Sunyoung Park, Sanghoon Lee, Yeonsung Kang, Byung-Gook Park, Jong-Ho Lee, Jooyoung Lee, Gyoyoung Jin, Hyungcheol Shin
Publikováno v:
2010 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 2010, p337-340, 4p
Autor:
Yun Young Yeoh, Sung Dae Suk, Ming Li, Kyoung Hwan Yeo, Dong-Won Kim, Gyoyoung Jin, Kyoungsuk Oh
Publikováno v:
2009 IEEE International Reliability Physics Symposium; 2009, p400-404, 5p
Autor:
Seungwon Yang, Kyoung Hwan Yeo, Dong-Won Kim, Kang-ill Seo, Donggun Park, Gyoyoung Jin, KyungSeok Oh, Hyungcheol Shin
Publikováno v:
2008 IEEE International Electron Devices Meeting; 2008, p1-4, 4p
Autor:
Sungsam Lee, Jongchul Park, Kwangwoo Lee, Sungho Jang, Junho Lee, Hyunsook Byun, Ilgweon Kim, Yongjin Choi, Myoungseob Shim, Duheon Song, Joosung Park, Taewoo Lee, Dongho Shin, Gyoyoung Jin, Kinam Kim
Publikováno v:
ESSDERC 2007 - 37th European Solid State Device Research Conference; 2007, p327-329, 3p
Autor:
Chang-sub Lee, Gyoyoung Jin, Keun-ho Lee, Jeong-taek Kong, Won-seong Lee, Yong-han Rho, Kan, E.C., Dutton, R.W.
Publikováno v:
International Conference on Simulation of Semiconductor Processes & Devices; 2002, p171-173, 3p
Publikováno v:
VLSI Design; 1998, Vol. 6 Issue 1-4, p299-302, 4p
Autor:
Changhyun Cho, Sangho Song, Sangho Kim, Sungho Jang, Sungsam Lee, Hyungtak Kim, Yangsoo Sung, Sangmin Jeon, Gisung Yeo, Youngsun Kim, Yungi Kim, Gyoyoung Jin, Kinam Kim
Publikováno v:
2005 Digest of Technical Papers. 2005 Symposium on VLSI Technology; 2005, p36-37, 2p
Publikováno v:
1996 International Conference on Simulation of Semiconductor Processes & Devices SISPAD '96 (IEEE Cat No96TH8095); 1996, p61-62, 2p
Publikováno v:
2014 IEEE International Reliability Physics Symposium; 2014, p2E.1.1-2E.1.4, 0p