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Akademický článek
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Autor:
Huang PH; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Chen S; Division of Electronics and Embedded Systems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Kista 16440, Sweden., Hartwig O; Institute of Physics, EIT 2, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Neubiberg 85577, Germany., Marschner DE; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Duesberg GS; Institute of Physics, EIT 2, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Neubiberg 85577, Germany., Stemme G; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Li J; Division of Electronics and Embedded Systems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Kista 16440, Sweden., Gylfason KB; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Niklaus F; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden.
Publikováno v:
ACS nano [ACS Nano] 2024 Oct 29; Vol. 18 (43), pp. 29748-29759. Date of Electronic Publication: 2024 Oct 09.
Autor:
Negm N; Advanced Microelectronic Center Aachen, AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany.; Chair of Electronic Devices (ELD), RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany., Zayouna S; Senseair AB, Stationsgatan 12, 824 08 Delsbo, Sweden.; Department of Applied Physics, KTH Royal Institute of Technology, Stationsgatan 12, 114 19 Stockholm, Sweden., Parhizkar S; Advanced Microelectronic Center Aachen, AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany.; Chair of Electronic Devices (ELD), RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany., Lin PS; Division of Micro- and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden., Huang PH; Division of Micro- and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden., Suckow S; Advanced Microelectronic Center Aachen, AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany., Schroeder S; Senseair AB, Stationsgatan 12, 824 08 Delsbo, Sweden., De Luca E; Senseair AB, Stationsgatan 12, 824 08 Delsbo, Sweden., Briano FO; Senseair AB, Stationsgatan 12, 824 08 Delsbo, Sweden., Quellmalz A; Division of Micro- and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden., Duesberg GS; Institute of Physics, Faculty of Electrical Engineering and Information Technology (EIT 4) & SENS Research Centre, University of the Bundeswehr Munich, Werner-Heisenberg-Weg 39, 85577 Neubiberg, Germany., Niklaus F; Division of Micro- and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden., Gylfason KB; Division of Micro- and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden., Lemme MC; Advanced Microelectronic Center Aachen, AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany.; Chair of Electronic Devices (ELD), RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany.
Publikováno v:
ACS photonics [ACS Photonics] 2024 Jun 26; Vol. 11 (8), pp. 2961-2969. Date of Electronic Publication: 2024 Jun 26 (Print Publication: 2024).
Autor:
Lai LL; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Huang PH; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Stemme G; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Niklaus F; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden., Gylfason KB; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm 10044, Sweden.
Publikováno v:
ACS nano [ACS Nano] 2024 Apr 23; Vol. 18 (16), pp. 10788-10797. Date of Electronic Publication: 2024 Mar 29.
Autor:
Quack N; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland.; School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Camperdown, NSW 2006 Australia., Takabayashi AY; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Sattari H; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland.; Swiss Center for Electronics and Microtechnology (CSEM), 2002 Neuchâtel, Switzerland., Edinger P; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Jo G; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Bleiker SJ; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Errando-Herranz C; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Gylfason KB; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Niklaus F; Division of Micro and Nanosystems, KTH Royal Institute of Technology, 114 28 Stockholm, Sweden., Khan U; Department of Information Technology, Photonics Research Group, Ghent University - IMEC, Technologiepark-Zwijnaarde 126, 9052 Gent, Belgium., Verheyen P; imec vzw. 3DSIP Department, Si Photonics Group, Kapeldreef 75, 3001 Leuven, Belgium., Mallik AK; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., Lee JS; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., Jezzini M; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., Zand I; Department of Information Technology, Photonics Research Group, Ghent University - IMEC, Technologiepark-Zwijnaarde 126, 9052 Gent, Belgium., Morrissey P; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., Antony C; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., O'Brien P; Tyndall National Institute, Lee Maltings Complex Dyke Parade, Cork, T12 R5CP Ireland., Bogaerts W; Department of Information Technology, Photonics Research Group, Ghent University - IMEC, Technologiepark-Zwijnaarde 126, 9052 Gent, Belgium.
Publikováno v:
Microsystems & nanoengineering [Microsyst Nanoeng] 2024 Jan 24; Vol. 10, pp. 17. Date of Electronic Publication: 2024 Jan 24 (Print Publication: 2024).
Autor:
Fan X; Advanced Research Institute of Multidisciplinary Sciences, Beijing Institute of Technology, Beijing 100081, China.; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, SE-10044 Stockholm, Sweden., Moreno-Garcia D; Advanced NEMS Group, École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Ding J; School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing 100081, China., Gylfason KB; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, SE-10044 Stockholm, Sweden., Villanueva LG; Advanced NEMS Group, École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Niklaus F; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, SE-10044 Stockholm, Sweden.
Publikováno v:
ACS applied nano materials [ACS Appl Nano Mater] 2023 Dec 01; Vol. 7 (1), pp. 102-109. Date of Electronic Publication: 2023 Dec 01 (Print Publication: 2024).
Autor:
Li Y; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Worsey E; University of Bristol, BS8 1UB Bristol, UK. Dinesh.Pamunuwa@bristol.ac.uk., Bleiker SJ; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Edinger P; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Kulsreshath MK; University of Bristol, BS8 1UB Bristol, UK. Dinesh.Pamunuwa@bristol.ac.uk., Tang Q; University of Bristol, BS8 1UB Bristol, UK. Dinesh.Pamunuwa@bristol.ac.uk., Takabayashi AY; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Quack N; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Verheyen P; IMEC, 3001 Leuven, Belgium., Bogaerts W; IMEC, 3001 Leuven, Belgium.; Ghent University, 9052 Gent, Belgium., Gylfason KB; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Pamunuwa D; University of Bristol, BS8 1UB Bristol, UK. Dinesh.Pamunuwa@bristol.ac.uk., Niklaus F; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se.
Publikováno v:
Nanoscale [Nanoscale] 2023 Nov 30; Vol. 15 (46), pp. 18940. Date of Electronic Publication: 2023 Nov 30.
Autor:
Li Y; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Worsey E; University of Bristol, BS8 1UB Bristol, UK., Bleiker SJ; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Edinger P; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Kulsreshath MK; University of Bristol, BS8 1UB Bristol, UK., Tang Q; University of Bristol, BS8 1UB Bristol, UK., Takabayashi AY; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Quack N; École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland., Verheyen P; IMEC, 3001 Leuven, Belgium., Bogaerts W; IMEC, 3001 Leuven, Belgium.; Ghent University, 9052 Gent, Belgium., Gylfason KB; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se., Pamunuwa D; University of Bristol, BS8 1UB Bristol, UK., Niklaus F; KTH Royal Institute of Technology, 11428 Stockholm, Sweden. frank@kth.se.
Publikováno v:
Nanoscale [Nanoscale] 2023 Nov 09; Vol. 15 (43), pp. 17335-17341. Date of Electronic Publication: 2023 Nov 09.
Autor:
Huang PH; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Laakso M; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Edinger P; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Hartwig O; Institute of Physics, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Neubiberg, 85577, Germany., Duesberg GS; Institute of Physics, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Neubiberg, 85577, Germany., Lai LL; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Mayer J; Central Facility for Electron Microscopy (GFE), RWTH Aachen University, Aachen, 52074, Germany., Nyman J; Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping, 58183, Sweden., Errando-Herranz C; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Stemme G; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Gylfason KB; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden., Niklaus F; Division of Micro and Nanosystems, School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, 10044, Sweden. frank@kth.se.
Publikováno v:
Nature communications [Nat Commun] 2023 Jun 07; Vol. 14 (1), pp. 3305. Date of Electronic Publication: 2023 Jun 07.
Autor:
Enrico A; Division of Micro and Nanosystems, KTH Royal Institute of Technology, Malvinas väg 10, 10044 Stockholm, Sweden., Hartwig O; Institute of Physics, EIT 2, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Werner-Heisenberg-Weg 39, 85577 Neubiberg, Germany., Dominik N; Institute of Physics, EIT 2, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Werner-Heisenberg-Weg 39, 85577 Neubiberg, Germany., Quellmalz A; Division of Micro and Nanosystems, KTH Royal Institute of Technology, Malvinas väg 10, 10044 Stockholm, Sweden., Gylfason KB; Division of Micro and Nanosystems, KTH Royal Institute of Technology, Malvinas väg 10, 10044 Stockholm, Sweden., Duesberg GS; Institute of Physics, EIT 2, Faculty of Electrical Engineering and Information Technology, University of the Bundeswehr Munich & SENS Research Center, Werner-Heisenberg-Weg 39, 85577 Neubiberg, Germany., Niklaus F; Division of Micro and Nanosystems, KTH Royal Institute of Technology, Malvinas väg 10, 10044 Stockholm, Sweden., Stemme G; Division of Micro and Nanosystems, KTH Royal Institute of Technology, Malvinas väg 10, 10044 Stockholm, Sweden.
Publikováno v:
ACS nano [ACS Nano] 2023 May 09; Vol. 17 (9), pp. 8041-8052. Date of Electronic Publication: 2023 Apr 19.