Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Gwangseok, Hwang"'
Autor:
Ohmyoung Kwon, Gwangseok Hwang
Publikováno v:
International Journal of Thermal Sciences. 108:81-88
With the rapid reduction in the characteristic length of electronic devices down to tens of nanometers in recent times, the characterization of self-heating in nanotransistors fabricated on silicon-on-insulator (SOI) substrates has become a major cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15f868798cbe5537cfd0af65817261d3
https://doi.org/10.1016/j.ijthermalsci.2016.05.002
https://doi.org/10.1016/j.ijthermalsci.2016.05.002
Autor:
Ohmyoung Kwon, Gwangseok Hwang
Publikováno v:
Nanoscale. 8:5280-5290
Using null-point scanning thermal microscopy (NP SThM), we have measured and analyzed the size dependence of the thermal conductivity of graphene. To do so, we rigorously re-derived the principal equation of NP SThM in terms of thermal property measu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d76960c659af3f0d358edd6d845626f7
https://doi.org/10.1039/c5nr08097e
https://doi.org/10.1039/c5nr08097e
Publikováno v:
Journal of Nanoscience and Nanotechnology. 15:9077-9082
In the development of graphene-based electronic devices, it is crucial to characterize the thermal contact resistance between the graphene and the substrate precisely. In this study, we demonstrate that the thermal contact resistance between CVD-grow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d417d229b6398509e6f050b43574c158
https://doi.org/10.1166/jnn.2015.11580
https://doi.org/10.1166/jnn.2015.11580
Autor:
Gwangseok Hwang, Hong Goo Kim, Jaehun Chung, Joon Sik Lee, Kichul Yoon, Ohmyoung Kwon, Kenneth D. Kihm
Publikováno v:
Carbon. 76:77-83
Despite the importance of the accurate measurement of the thermal conductivity of graphene, deviations in previous data are still quite large due to the low signal-to-noise ratio in the measurement of graphene temperature, the uncertainties in the me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2d52c285b59c12ea97b8e248dbddd4f
https://doi.org/10.1016/j.carbon.2014.04.051
https://doi.org/10.1016/j.carbon.2014.04.051
Publikováno v:
Ultramicroscopy. 171
With the vigorous development of new nanodevices and nanomaterials, improvements in the quantitation and resolution of the measurement of nanoscale energy transport/conversion phenomena have become increasingly important. Although several new advance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5d6f1d7563ee2c3916411de7363bca4e
https://pubmed.ncbi.nlm.nih.gov/27694037
https://pubmed.ncbi.nlm.nih.gov/27694037
Publikováno v:
Journal of nanoscience and nanotechnology. 15(11)
In the development of graphene-based electronic devices, it is crucial to characterize the thermal contact resistance between the graphene and the substrate precisely. In this study, we demonstrate that the thermal contact resistance between CVD-grow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::dc4a77fb8d37b4aec4386e8356d7ed74
https://pubmed.ncbi.nlm.nih.gov/26726646
https://pubmed.ncbi.nlm.nih.gov/26726646
Autor:
Gwangseok Hwang, Sung Jin Kim, Jungwon Kim, Kyungbae Park, Hayeong Kim, Ohmyoung Kwon, Woochul Kim
Publikováno v:
Applied Physics Letters. 108:071907
With the increasing application of nanomaterials in the development of high-efficiency thermoelectric energy conversion materials and electronic devices, the measurement of the intrinsic thermal conductivity of nanomaterials in the form of nanowires
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3abe8ace2dd0b965406287058e7e7b90
https://doi.org/10.1063/1.4942098
https://doi.org/10.1063/1.4942098
Publikováno v:
2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO).
For graphene-based electronic devices, it is crucial to measure and analyze the thermal contact resistance between the graphene and the insulating layer. Herein, we measure the thermal contact resistance between CVD-grown graphene and a SiO 2 layer u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2baa428ec63235d18614c3267690c1d0
https://doi.org/10.1109/nano.2012.6322115
https://doi.org/10.1109/nano.2012.6322115
Publikováno v:
ACS nano. 5(11)
Because of its high spatial resolution, scanning thermal microscopy (SThM) has been developed quite actively and applied in such diverse areas as microelectronics, optoelectronics, polymers, and carbon nanotubes for more than a decade since the 1990s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c66f2c33e970f5d04a0ac73c651310e7
https://pubmed.ncbi.nlm.nih.gov/21999681
https://pubmed.ncbi.nlm.nih.gov/21999681
Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave
Autor:
Jaehun Chung, Joon Sik Lee, Gwangseok Hwang, Seungho Park, Kyeongtae Kim, Ohmyoung Kwon, Young Ki Choi
Publikováno v:
The Review of scientific instruments. 81(5)
The need for a subsurface imaging technique to locate and characterize subsurface defects in multidimensional micro- and nanoengineered devices has been growing rapidly. We show that a subsurface heater can be located accurately using the phase lag o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20c5c76594548c4c41860d9baa43d8a8
https://pubmed.ncbi.nlm.nih.gov/20515139
https://pubmed.ncbi.nlm.nih.gov/20515139