Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Gunter Strobe"'
Publikováno v:
Scopus-Elsevier
SBCCI
SBCCI
Due to increasing CMOS process variability, optimization for yield has become one of the crucial tasks in Integrated Circuit (IC) design especially in analog IC design. This variability is getting worse with the continuous scaling of device dimension
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe41424d94f58f8e526a76f744735bbf
http://www.scopus.com/inward/record.url?eid=2-s2.0-84870853249&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-84870853249&partnerID=MN8TOARS