Zobrazeno 1 - 10
of 125
pro vyhledávání: '"Gundlach, A.M."'
Publikováno v:
In Microelectronic Engineering May-June 2008 85(5-6):1059-1061
Autor:
Hilton, G.C., Beall, J.A., Doriese, W.B., Duncan, W.D., Ferreira, L.S., Irwin, K.D., Reintsema, C.D., Ullom, J.N., Vale, L.R., Xu, Y., Zink, B.L., Parkes, W., Bunting, A.S., Dunare, C.C., Gundlach, A.M., Stevenson, J.T.M., Walton, A.J., Schulte, E., Corrales, E., Sienicki, J.P., Bintley, Dan, Ade, P.A.R., Sudiwala, Rashmi V., Woodcraft, Adam L., Halpern, Mark, Holland, W., Audley, M.D., MacIntosh, M.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 2006 559(2):513-515
Autor:
Horsfall, A.B., dos Santos, J.M.M., Soare, S.M., Wright, N.G., O’Neill, A.G., Bull, S.J., Walton, A.J., Gundlach, A.M., Stevenson, J.T.M.
Publikováno v:
In Microelectronics Reliability 2003 43(9):1797-1801
Autor:
Bodammer, G., Vass, D.G., Underwood, I., Calton, D.W., Miremont, C., Zheng, W., Stevenson, J.T.M., Gundlach, A.M., Walton, A.J.
Publikováno v:
In Smart Materials Bulletin 2000 2000(12):5-8
Publikováno v:
In Sensors & Actuators: A. Physical 1999 78(1):18-27
Publikováno v:
2008 IEEE International Conference on Microelectronic Test Structures; 2008, p123-127, 5p
Autor:
Shulver, B.J.R., Allen, R.A., Walton, A.J., Cresswell, M.W., Stevenson, J.T.M., Smith, S., Bunting, A.S., Dunare, C., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p165-170, 6p
Autor:
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Smith, S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p14-19, 6p
Autor:
Lin, H., Walton, A.J., Dunarc, C.C., Stevenson, J.T.M., Gundlach, A.M., Smith, S., Bunting, A.S.
Publikováno v:
2006 IEEE International Conference on Microelectronic Test Structures; 2006, p143-148, 6p
Autor:
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Publikováno v:
2006 IEEE International Conference on Microelectronic Test Structures; 2006, p124-129, 6p